The following terms were included:
"cellular telephone", Mobiltelefon, "Smart Phones", "Smart Phone", Smartphone, Handy, "cellular phone", "mobile phone", "cell phone", セルラー電話, 携帯電話
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2022,
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2022 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: 218-222; ISBN 978-1-6654-8995-9
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2022,
Ranjitsingh AJA, Mathew EM, Dhasarathan P, Athinarayanan G
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2022,
Fontá Romero C, Auñón Marugán A, Rodríguez Varela F, Bielza López P, Alcolea Coronel JL, Alonso Montes JI, Sierra Castañer M
2022 Antenna Measurement Techniques Association Symposium (AMTA), Denver, CO, USA. IEEE: 1-5; ISBN 978-1-6654-8427-5
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2022,
Minucci F, Verbruggen D, Sallouah H, Volski V, Vandenbosch G, Bovety G, Pollin S
IEEE Open J Commun Soc 3: 2258-2271
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2022,
Dsilva MH, Swer RT, Anbalagan J
J Clin of Diagn Res 16 (10)
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2022,
Zhang S, Mo F, Chang Y, Wu S, Ma Q, Jin F, Xing L
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2022,
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2022,
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2022,
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2022,
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BMC Public Health 22: 2031
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2022,
Banerjee K, Thind A, Bhatnagar N, Singla B, Agria K, Bajaj P, Jindal A, Arora S, Goyal P, Mittal B, Malhotra K, Pai H, Malhotra J, Goel P, Jindal N
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2022,
Kopani M, Panik J, Filova B, Bujdos M, Misek J, Kohan M, Jakus J, Povinec P
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2022,
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Curr Epidemiol Rep 9 (4): 338–360
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2022,
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2022,
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2022 20th International Symposium on Modeling and Optimization in Mobile, Ad hoc, and Wireless Networks (WiOpt), Torino, Italy. IEEE: 383-390; ISBN 978-1-6654-6076-7
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2022,
Borzoueisileh S, Shabestani Monfared A, Mortazavi SMJ, Zabihi E, Pouramir M, Niksirat F, Seyfizadeh N, Shafiee M
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2022,
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2022,
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2022 23rd International Conference on Computational Problems of Electrical Engineering (CPEE), Zuberec, Slovakia. IEEE: 1-4; ISBN 9798350396263
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2022,
Long T, Jiang C, Sang W, Gu Y, Ding J, Li L
IEEE Trans Instrum Meas 71: 1-9
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2022 23rd International Conference on Computational Problems of Electrical Engineering (CPEE), Zuberec, Slovakia. IEEE: 1-4; ISBN 9798350396263
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2022,
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2022,
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IEEE Journal on Multiscale and Multiphysics Computational Techniques 7: 304-311
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2022,
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2022,
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2022 International Conference on Software, Telecommunications and Computer Networks (SoftCOM), Split, Croatia. IEEE: 1-6; ISBN 978-1-6654-7018-6
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2022,
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2022,
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2022,
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2022,
Li S, Jiang Y, Tang C, Luo Z, Liu L, Li Z, Gu C
2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), Beijing, China. IEEE: 563-565; ISBN 978-1-6654-1672-6
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2022,
Al-Khlaiwi T, Habib SS, Alshalan M, Al-Qhatani M, Alsowiegh S, Queid S, Alyabis O, Al-Khliwi H
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2022,
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2022 13th International Symposium on Communication Systems, Networks and Digital Signal Processing (CSNDSP), Porto, Portugal. IEEE: 258-262; ISBN 978-1-6654-1045-8
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2022 International Symposium on Electromagnetic Compatibility – EMC Europe, Gothenburg, Sweden. IEEE: 525-530; ISBN 978-1-6654-0789-2
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2022 International Symposium on Electromagnetic Compatibility – EMC Europe, Gothenburg, Sweden. IEEE: 145-150; ISBN 978-1-6654-0789-2
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2022,
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IEEE Trans Antennas Propag 70 (12): 11629-11638
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2022,
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2022 International Symposium ELMAR, Zadar, Croatia. IEEE: 19-22; ISBN 978-1-6654-7004-9
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2022,
Chiaraviglio L, Lodovisi C, Franci D, Pavoncello S, Aureli T
2022 IEEE International Symposium on Measurements & Networking (M&N), Padua, Italy. IEEE: 1-6; ISBN 978-1-6654-8363-6
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2022,
Varheenmaa H, Lehtovuori A, Ylä-Oijala P, Viikari V
IEEE Open Journal of Antennas and Propagation 3: 1154-1160
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2022,
Betta G, Capriglione D, Cerro G, Miele G, Migliore MD, Šuka D
2022 IEEE International Symposium on Measurements & Networking (M&N), Padua, Italy. IEEE: 1-6; ISBN 978-1-6654-8363-6
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2022,
Adda S, Aureli T, Cassano T, Franci D, Migliore MD, Pasquino N, Pavoncello S, Schettino F, Schirone M
2022 IEEE International Symposium on Measurements & Networking (M&N), Padua, Italy. IEEE: 1-6; ISBN 978-1-6654-8363-6
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2022,
Migliore MD, Franci D, Pavoncello S, Aureli T, Merli E, Lodovisi C, Chiaraviglio L, Schettino F
IEEE Access 10: 103438-103446
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2022,
Djuric N, Kljajic D, Gavrilov T, Otasevic V, Djuric S
2022 IEEE International Symposium on Measurements & Networking (M&N), Padua, Italy. IEEE: 1-6; ISBN 978-1-6654-8363-6
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2022,
Chiaraviglio L, Lodovisi C, Franci D, Grillo E, Pavoncello S, Aureli T, Blefari-Melazzi N, Alouini MS
IEEE Open J Commun Soc 3: 1592-1614