The following terms were included:
"deoxyribonucleic acid", Desoxyribonukleinsäure, DNA, DNS, デオキシリボ核酸
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2019,
Ansal KA, Jose DS, Rajan RK
2018 International Conference on Circuits and Systems in Digital Enterprise Technology (ICCSDET), Kottayam, India. IEEE: 1-5; ISBN 978-1-5386-0577-6
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2018,
Herrala M, Kumari K, Blomme A, Khan MW, Koivisto H, Naarala J, Roivainen P, Tanila H, Viluksela M, Juutilainen J
Eskola H, Väisänen O, Viik J, Hyttinen J (eds.): EMBEC & NBC 2017: Joint Conference of the European Medical and Biological Engineering Conference (EMBEC) and the Nordic-Baltic Conference on Biomedical Engineering and Medical Physics (NBC), Tampere, Finland, June 2017. IFMBE Proceedings, volume 65; Springer, Singapore; 719-722; ISBN 978-981-10-5121-0
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2018 EMF-Med 1st World Conference on Biomedical Applications of Electromagnetic Fields (EMF-Med), Split, Croatia. IEEE: 1-2; ISBN 978-1-5386-5922-9
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2018,
Wang F, Wang Y, Huang T, Guo F, Liu J, Song Z, Weng Z, Wang Z, Wang Z
2017 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), Shanghai, China. IEEE: 174-177; ISBN 978-1-5386-1082-4
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Mobile Communications and Public Health. CRC Press: 165-186; ISBN 978-1-138-56842-6
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2018,
Cantu JC, Peralta XG, Cerna CZ, Echchzadda I
2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Nagoya, Japan. 11th edition; IEEE: 1-2; ISBN 978-1-5386-3810-1
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2018,
Wyde M, Cesta M, Blystone C, Elmore S, Foster P, Hooth M, Kissling G, Malarkey D, Sills R, Stout M, Walker N, Witt K, Wolfe M, Bucher J
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2017,
Sun W, He Y, Diao Y, Leung SW, Siu YM, Kong R
2017 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), Seoul, Korea (South). IEEE; ISBN 978-1-5386-3913-9
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2016 8th International Conference on Ultrawideband and Ultrashort Impulse Signals (UWBUSIS), Odessa, Ukraine. IEEE: 54-57; ISBN 978-1-5090-1580-1
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2016,
Gümüşay M, Gülbağça F, Sayğili S, Aydemir I, Kaya A, Tuğlu MI
[2016 Medical Technologies National Congress (TIPTEKNO), Antalya, Turkey]. IEEE; ISBN 978-1-5090-2387-5