The following terms were included:
"evozierte Potenziale", EP, "evoked potentials", 誘発電位
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Levin KH, Chauvel P (eds.): Clinical Neurophysiology: Basis and Technical Aspects. Handbook of Clinical Neurology, volume 160; Elsevier, Amsterdam; 559-580; ISBN 978-0-444-64032-1
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2018,
Zhao Y, Lai JJ, Wu XY, Qu W, Wang MQ, Chen L, Hu N, Wang X, Hou WS
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: 2240-2243; ISBN 978-1-5386-3647-3
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2018,
Bhangari DS, Bhagali AC, Kshirsagar RV
2018 Second International Conference on Intelligent Computing and Control Systems (ICICCS), Madurai, India. IEEE: 1679-1683; ISBN 978-1-5386-2843-0
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2018,
Sweeney DC, Davalos RV
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: 5850-5853; ISBN 978-1-5386-3647-3
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2018,
Boyer A, Duffau H, Vincent M, Ramdani S, Mandonnet E, Guiraud D, Bonnetblanc F
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: 2210-2213; ISBN 978-1-5386-3647-3
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2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: 4764-4767; ISBN 978-1-5386-3647-3
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2018,
Malkemper EP, Tscheulin T, Vanbergen AJ, Vian A, Balian E, Goudeseune L
1-28
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2017,
Whungtrakulchai T, Charoenwat W, Sittiprapaporn P
2017 14th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON), Phuket, Thailand. IEEE; ISBN 978-1-5386-0450-2
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2016,
Vincent M, Rossel O, Duffau H, Bonnetblanc F, Guiraud D
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 4543-4546; ISBN 978-1-4577-0220-4
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2016,
Cosoli G, Scalise L, Tricarico G, Tomasini EP, Cerri G
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 5652-5655; ISBN 978-1-4577-0220-4