The following terms were included:
"exposure assessment", Expositionsabschätzung, ばく露評価
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2022 IEEE International RF and Microwave Conference (RFM), Kuala Lumpur, Malaysia. IEEE: 1-4; ISBN 978-1-6654-8978-2
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2022,
Bräunlich R, Dalmus C, Dongus S, Eberhard J, Friedrich G, Fröhlich J, Röösli M, Schürmann D
Swiss Federal Office of Energy (SFOE),
Statusbericht 2022: 1-204
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2022,
Lee SW, Kim N, Kwon JH, Choi HD, Lee SB, Kim EJ
2022 IEEE 11th Global Conference on Consumer Electronics (GCCE), Osaka, Japan. IEEE: 391-392; ISBN 978-1-6654-9233-1
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2022,
Kushiyama Y, Nagaoka T
2022 Asia-Pacific Microwave Conference (APMC), Yokohama, Japan. IEEE: 961-963; ISBN 978-1-6654-5108-6
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2022,
Chountala C, Chareau JM, Baldini G, Bonavitacola F
2022 9th International Conference on Wireless Networks and Mobile Communications (WINCOM), Rabat, Morocco. IEEE: 1-6; ISBN 978-1-6654-5277-9
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2022,
Sârbu A, Şorecău E, Şorecău M, Miclăuş S, Bechet P
2022 IEEE 9th Electronics System-Integration Technology Conference (ESTC), Sibiu, Romania. IEEE: 597-602; ISBN 978-1-6654-8948-5
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2022,
Kapetanović AL, Šušnjara A, Poljak D, Russo M
2022 International Conference on Software, Telecommunications and Computer Networks (SoftCOM), Split, Croatia. IEEE: 1-5; ISBN 978-1-6654-7018-6
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2022,
Galic M, Crnolatec M, Poljak D
2022 International Conference on Software, Telecommunications and Computer Networks (SoftCOM), Split, Croatia. IEEE: 1-6; ISBN 978-1-6654-7018-6
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2022 International Symposium on Electromagnetic Compatibility – EMC Europe, Gothenburg, Sweden. IEEE: 311-316; ISBN 978-1-6654-0789-2
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2022,
Adda S, Aureli T, Cassano T, Franci D, Migliore MD, Pasquino N, Pavoncello S, Schettino F, Schirone M
2022 IEEE International Symposium on Measurements & Networking (M&N), Padua, Italy. IEEE: 1-6; ISBN 978-1-6654-8363-6