The following terms were included:
"high voltage", Hochspannung, 高電圧
-
2024,
Mölter A, Jalilian H, Röösli M, de Vocht F, Pilla F
Environmental Protection Agency (EPA),
EPA Research Report No.452: 1-42, ISBN 978-1-80009-155-9
-
2024,
Competence Centre Electromagnetic Fields (KEMF)
Federal Office for Radiation Protection (BfS) (ed.),
Spotlight, Jan/2024 no.3: 1-3
-
2024,
Competence Centre Electromagnetic Fields (KEMF)
Federal Office for Radiation Protection (BfS) (ed.),
Spotlight, Jan/2024 no.2: 1-8
-
2024 32nd Southern African Universities Power Engineering Conference (SAUPEC), Stellenbosch, South Africa. IEEE: 1-6; ISBN 9798350371352
-
2023,
Buono L, Guarniere MR, Marzinotto M, Palone F, Papi L, Spezie R, Tresso G, Vacante P, Pigini A, Cortina R
2023 AEIT HVDC International Conference (AEIT HVDC), Rome, Italy. IEEE: 1-6; ISBN 9798350324907
-
2023,
Competence Centre Electromagnetic Fields (KEMF)
Federal Office for Radiation Protection (BfS) (ed.),
Spotlight, Jun/2023 no.3: 1-3
-
2023,
Al Salameh MSH, Al-Zughool MR
2023 24th International Conference on Applied Electromagnetics and Communications (ICECOM), Dubrovnik, Croatia. IEEE: 1-4; ISBN 9798350313024
-
2023,
Gao C, Zhang Z, Xu J, Gao T, Chen S, Li X
2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM), Seattle, WA, USA. IEEE: 1-7; ISBN 9798350342475
-
2023,
Liu L, Liao M, Jia L, Li B, Wan W
2023 2nd International Conference on Power Electronics and Electrical Technology, Chongqing, China. Journal of Physics: Conference Series, volume 2656; IOP Publishing: 012013; ISBN 978-1-7138-8535-1
-
2023,
Nazemi M, Dommerque R, Daniel S
2023 International Symposium on Electromagnetic Compatibility – EMC Europe, Krakow, Poland. IEEE: 1-6; ISBN 9798350324013
-
2023,
Boukabou I, Rupanetti D, Kaabouch N, Foust L
2023 IEEE Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMC+SIPI), Grand Rapids, MI, USA. IEEE: 413-418; ISBN 9798350309775
-
2023,
Huber P, Mohanty P, Jenau F
2023 IEEE Electrical Insulation Conference (EIC), Quebec City, QC, Canada. IEEE: 1-4; ISBN 978-1-6654-9342-0
-
2023,
Chavan PK, Autade SB, Pardeshi DB, William P
2023 5th International Conference on Inventive Research in Computing Applications (ICIRCA), Coimbatore, India. IEEE: 1714-1718; ISBN 9798350321432
-
2023 10th International Conference on Modern Power Systems (MPS), Cluj-Napoca, Romania. IEEE: 01-05; ISBN 9798350326833
-
2023,
Cui H, Zhu F, Wu Q, Zhang X, Guo Y
2023 Panda Forum on Power and Energy (PandaFPE), Chengdu, China. IEEE: 812-817; ISBN 9798350321180
-
2022,
Ramirez-Bettoni E, Nemeth B
2022 IEEE IAS Electrical Safety Workshop (ESW), Jacksonville, FL, USA. IEEE: 1-9; ISBN 978-1-6654-7864-9
-
2022,
Li Y, Liu D, Zhang J, Wu L
2022 International Conference on Mechanical and Electronics Engineering (ICMEE), Xi'an, China. IEEE: 162-166; ISBN 978-1-6654-9221-8
-
2022,
Bräunlich R, Dalmus C, Dongus S, Eberhard J, Friedrich G, Fröhlich J, Röösli M, Schürmann D
Swiss Federal Office of Energy (SFOE),
Statusbericht 2022: 1-204
-
2022,
Liu Z, Hao W, Huang R
2022 IEEE Conference on Telecommunications, Optics and Computer Science (TOCS), Dalian, China. IEEE: 1157-1162; ISBN 978-1-6654-7054-4
-
2022,
Ivanova M, Barudov E
2022 14th Electrical Engineering Faculty Conference (BulEF), Varna, Bulgaria. IEEE: 1-4; ISBN 978-1-6654-9027-6
-
2022,
Badwey MA, Abbasy NH, Eldallal GM
2022 23rd International Middle East Power Systems Conference (MEPCON), Cairo, Egypt. IEEE: 1-8; ISBN 978-1-6654-6364-5
-
2022,
Boukabou I, Foust L, Benouadah S, Rupanetti D, Wolf J, Kaabouch N
2022 North American Power Symposium (NAPS), Salt Lake City, UT, USA. IEEE: 1-6; ISBN 978-1-6654-9922-4
-
2022,
Kim D, Kim M, Lee S, Lee Y, Kim Y
2022 9th International Conference on Condition Monitoring and Diagnosis (CMD), Kitakyushu, Japan. IEEE: 687-690; ISBN 978-1-6654-7015-5
-
2022,
Amicucci GL, Settino MT
2022 International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME), Maldives, Maldives. IEEE: 1-7; ISBN 978-1-6654-7096-4
-
2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE), Chongqing, China. IEEE: 1-4; ISBN 978-1-6654-0751-9