The following terms were included:
"occupational exposure", "berufliche Exposition", 職業ばく露
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2018,
Mohamed AAS, Meintz A, Schrafel P, Calabro A
2018 IEEE Vehicle Power and Propulsion Conference (VPPC), Chicago, IL, USA. IEEE: 1-6; ISBN 978-1-5386-6204-5
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2018,
Mitani T, Nishio D, Shinohara N
2018 Asia-Pacific Microwave Conference (APMC), Kyoto, Japan. IEEE: 1142-1144; ISBN 978-1-5386-2184-4
-
2018 International Conference on Applied and Theoretical Electricity (ICATE), Craiova, Romania. IEEE: 1-6; ISBN 978-1-5386-3807-1
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2018,
Galante A, Alecci M, Fantasia M, Rinaldiop C, Federici F, Franchi F
2018 IEEE International Symposium on Medical Measurements and Applications (MeMeA), Rome, Italy. IEEE: 1-5; ISBN 978-1-5386-3393-9
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2018,
Raquib MA, Hossain MS
2017 2nd International Conference on Electrical & Electronic Engineering (ICEEE), Rajshahi, Bangladesh. IEEE: 1-4; ISBN 978-1-5386-3342-7
-
National Institute for Public Health and the Environment (RIVM),
Update of RIVM report (118/2011): 1-18
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2017,
Karpowicz J, Miclaus S, Gryz K
2017 E-Health and Bioengineering Conference (EHB), Sinaia, Romania. IEEE: 607-610; ISBN 978-1-5386-1514-0
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2017,
Anifantis AS, Pascuzzi S, Santoro F
Lorencowicz E, Uziak J, Huyghebaert B (eds.): Farm Machinery and Process Management in Sustainable Agriculture: Symposium Proceedings of the IX International Scientific Symposium. University of Life Sciences, Lublin, Poland; 32-36; ISBN 978-83-937433-2-2
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German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE),
DIN EN 50527-2-1 VDE 0848-527-2-1:2017-12
-
German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE),
DIN EN 50527-1 VDE 0848-527-1:2017-12
-
German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE),
DIN EN 50122-1 VDE 0115-3:2017-10
-
2017,
Pascuzzi S, Santoro F
16th International Scientific Conference: Engineering for Rural Development. Latvian University of Agriculture, Jelgava, Latvia: 748-755
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2017,
Simakov A, Onishchenko E, Gurkovskiy B, Butuzov V, Bocharov Y, Vodokhlebov I, Pershenkov V, Zhuravlev B, Trifonova N
2017 IEEE Workshop on Environmental, Energy, and Structural Monitoring Systems (EESMS), Milan, Italy. IEEE: 1-4; ISBN 978-1-5386-2817-1
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2017,
Kuznetsov K, Zakirova A, Averyanov U
2017 International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM), St. Petersburg, Russia. IEEE: 1-4; ISBN 978-1-5090-5649-1
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2017,
Ozen S, Carlak HF, Colak OH, Helhel S
2017 Progress In Electromagnetics Research Symposium - Spring (PIERS), St. Petersburg, Russia. IEEE: 1743-1746; ISBN 978-1-5090-6270-6
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2017 12th International Conference on Live Maintenance (ICOLIM), Strasbourg, France. IEEE: 1-5; ISBN 978-1-5090-3369-0
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2017,
Dürrenberger G, Leuchtmann P, Röösli M, Siegrist M, Sütterlin B
Swiss Federal Office of Energy (SFOE),
Statusbericht 2017: 1-125
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2017,
Michałowska J, Józwik J, Mika D, Krawczyk A
IEEE EUROCON 2017 -17th International Conference on Smart Technologies, Ohrid, Macedonia. IEEE; ISBN 978-1-5090-3844-2
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2017,
Bisceglia B, Valbonesi S, Carciofi C
2017 International Applied Computational Electromagnetics Society Symposium - Italy (ACES), Florence. IEEE; ISBN 978-0-9960078-3-2
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2016,
Canova A, Freschi F, Giaccone L
2016 IEEE Industry Applications Society Annual Meeting, Portland, OR, USA. IEEE: 1-7; ISBN 978-1-4799-8398-8
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German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE),
DIN EN 61140 VDE 0140-1:2016-11
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2016,
Biological Effects Policy Advisory Group (BEPAG)
The Institution of Engineering and Technology (IET),
IET Position statement - July 2016: 1-22
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International Telecommunication Union (ITU),
ITU-T Recommendations K-Series, K.122 (12/2016): 1-70
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2016,
Korpinen L, Pääkkönen R, Farrugia L, Tarao H, Gobba F
2016 Progress in Electromagnetic Research Symposium (PIERS), Shanghai, China. IEEE: 2106-2108; ISBN 978-1-5090-6094-8
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2016,
Karpowicz J, Bienkowski P, Kieliszek J
2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Wroclaw, Poland. IEEE: 668-671; ISBN 978-1-5090-1417-0