The following terms were included:
"occupational exposure", "berufliche Exposition", 職業ばく露
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2019,
Vila J, Bowman JD, Figuerola J, Moriña D, Kincl L, Richardson L, Cardis E, INTEROCC Study Group
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2019,
Hartwig V, Biagini C, De Marchi D, Flori A, Gabellieri C, Virgili G, Ferrante Vero LF, Landini L, Vanello N, Giovannetti G
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2019,
Filice S, Rossi R, Crisi G
Radiat Prot Dosimetry 185 (3): 326-330
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2019,
Schmid G, Hirtl R, Samaras T
J Radiol Prot 39 (2): 455-469
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2019,
Rochoy M, Rivas V, Chazard E, Decarpentry E, Saudemont G, Hazard PA, Puisieux F, Gautier S, Bordet R
J Prev Alzheimers Dis 6 (2): 121-134
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2019,
Hamnerius Y, Nilsson T, Friman E
J Radiol Prot 39 (1): 150-160
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2019,
Gunnarsson LG, Bodin L
Int J Environ Res Public Health 16 (3): E337
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2019,
Peters S, Visser AE, D'Ovidio F, Beghi E, Chiò A, Logroscino G, Hardiman O, Kromhout H, Huss A, Veldink J, Vermeulen R, van den Berg LH
Am J Epidemiol 188 (4): 796-805
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2019,
Gao H, Aresu M, Vergnaud AC, McRobie D, Spear J, Heard A, Kongsgård HW, Singh D, Muller DC, Elliott P
Br J Cancer 120 (3): 375-378
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2019,
Hosseinabadi MB, Khanjani N, Ebrahimi MH, Haji B, Abdolahfard M
Electromagn Biol Med 38 (1): 96-101
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2019,
Gurrera D, Gallias KK, Spanò M, Abbate BF, D'Alia F, Iacoviello G, Caputo V
Phys Med 57: 238-244
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2019,
Chen H, Chen Z, Wang J, Tian P, Shen YM, Huang L, Hu XH
J Burn Care Res 40 (1): 128-132
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2019,
Korpinen L, Pääkkönen R
Int J Occup Saf Ergon 25 (1): 161-164
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2020,
Xiao D, Zhou C, Ma Q, Lei J, Du X
IEEE Trans Instrum Meas 69 (12): 9389-9397
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2020,
Garcia RM, Novas N, Alcayde A, El Khaled D, Fernandez-Ros M, Gazquez JA
Appl Sci 10 (10): 3494
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Electron Commun Jpn 103 (1-4): 10-18
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2020,
Ghnimi S, Gharsallah A
J Electr Syst 16 (1): 134-145
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2020,
Mannan M, Weldu YW, Al-Ghamdi SG
Energy Rep 6 Suppl 1: 915-920
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Arch Electr Eng 69 (1): 57-68
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2020,
Rathebe P, Weyers C, Raphela F
Health Technol 10 (1): 39-50
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German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE),
DIN EN 50499 VDE 0848-499:2020-12
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International Telecommunication Union (ITU),
ITU-T Recommendations K-Series, K.70 (12/2020): 1-54
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2020,
Aksenov V, Zavyalov A, Chaplygin V, Sorokina E
E3S Web Conf 157: 04013
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2020,
Zhang W, Song G, Zhao Q, Qi X
2020 6th Global Electromagnetic Compatibility Conference (GEMCCON), XI'AN, China. IEEE: 1-4; ISBN 978-1-7281-8464-7
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2020,
Arora S, Khan Y, Suri T, Gupta S
JBJS Case Connect 10 (4): e2000143