The following terms were included:
"power transmission line", Hochspannungsfreileitung, Hochspannungsleitung, "high-voltage line", "transmission line", "power line", HVOTL, 高電圧線, 送電線, 電力線
-
2023,
Voicu V, Dina LA, Mircea PM, Dumbrava I
2023 Power Quality and Electromagnetic Compatibility at Low Frequency (PQEMC-LF), Craiova, Romania. IEEE: 61-64; ISBN 9798350341348
-
2023,
Eccleston DT, Dwyer JF, Harness RE, Barnes TA, Downie J
2023 IEEE Rural Electric Power Conference (REPC), Cleveland, OH, USA. IEEE: 32-38; ISBN 9798350321746
-
2023 10th International Conference on Modern Power Systems (MPS), Cluj-Napoca, Romania. IEEE: 01-05; ISBN 9798350326833
-
2023,
Cui H, Zhu F, Wu Q, Zhang X, Guo Y
2023 Panda Forum on Power and Energy (PandaFPE), Chengdu, China. IEEE: 812-817; ISBN 9798350321180
-
2023,
Costea M, Leonida T
2023 13th International Symposium on Advanced Topics in Electrical Engineering (ATEE), Bucharest, Romania. IEEE: 1-6; ISBN 9798350331943
-
2023,
Valentum Kommunikation GmbH
Federal Office for Radiation Protection (BfS),
Ressortforschungsberichte zum Strahlenschutz, BfS-RESFOR-209/23: 1-10
-
2023,
Hooli SS, Vadde A, Kadambi GR, Manickavasagam K
2023 International Conference on Power, Instrumentation, Energy and Control (PIECON), Aligarh, India. IEEE: 1-6; ISBN 9798350399776
-
2023,
Jamshed MA, Héliot F, Brown TWC, Ur Rehman M
Ur Rehman M, Jamshed MA (eds.): Low Electromagnetic Field Exposure Wireless Devices: Fundamentals and Recent Advances. Wiley-IEEE Press; 1-18; ISBN 978-1-119-90916-3
-
2022,
Ramirez-Bettoni E, Nemeth B
2022 IEEE IAS Electrical Safety Workshop (ESW), Jacksonville, FL, USA. IEEE: 1-9; ISBN 978-1-6654-7864-9
-
2022,
Nordin MA, Sapuan SZ, Arokiaswami A, Nasimuddin N, Othman N, Fahrul M, Amer AAG
2022 IEEE International RF and Microwave Conference (RFM), Kuala Lumpur, Malaysia. IEEE: 1-3; ISBN 978-1-6654-8978-2
-
2022,
Li Y, Liu D, Zhang J, Wu L
2022 International Conference on Mechanical and Electronics Engineering (ICMEE), Xi'an, China. IEEE: 162-166; ISBN 978-1-6654-9221-8
-
2022,
Bräunlich R, Dalmus C, Dongus S, Eberhard J, Friedrich G, Fröhlich J, Röösli M, Schürmann D
Swiss Federal Office of Energy (SFOE),
Statusbericht 2022: 1-204
-
2022,
Liu Z, Hao W, Huang R
2022 IEEE Conference on Telecommunications, Optics and Computer Science (TOCS), Dalian, China. IEEE: 1157-1162; ISBN 978-1-6654-7054-4
-
2022,
Mulot M, Kroeber T, Gossner M, Fröhlich J
Bericht im Auftrag des Bundesamts für Umwelt (BAFU): 1-87
-
2022,
Boukabou I, Foust L, Benouadah S, Rupanetti D, Wolf J, Kaabouch N
2022 North American Power Symposium (NAPS), Salt Lake City, UT, USA. IEEE: 1-6; ISBN 978-1-6654-9922-4
-
Springer, Cham; ISBN 978-3-030-98773-2
-
2022,
Kim D, Kim M, Lee S, Lee Y, Kim Y
2022 9th International Conference on Condition Monitoring and Diagnosis (CMD), Kitakyushu, Japan. IEEE: 687-690; ISBN 978-1-6654-7015-5
-
2022,
Amicucci GL, Settino MT
2022 International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME), Maldives, Maldives. IEEE: 1-7; ISBN 978-1-6654-7096-4
-
2022 IEEE ANDESCON, Barranquilla, Colombia. IEEE: 1-7; ISBN 978-1-6654-8855-6
-
2022,
Nourredine T, Rabah D, Abdechafik H
2022 19th International Multi-Conference on Systems, Signals & Devices (SSD), Sétif, Algeria. IEEE: 1813-1819; ISBN 978-1-6654-7109-1
-
2022,
Glyva V, Levchenko L, Auscheva N, Tykhenko O
2022 IEEE 8th International Conference on Energy Smart Systems (ESS), Kyiv, Ukraine. IEEE: 288-291; ISBN 9798350334425
-
2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE), Chongqing, China. IEEE: 1-4; ISBN 978-1-6654-0751-9
-
2022,
Houicher SE, Djekidel R, Bessedik SA
2022 19th International Multi-Conference on Systems, Signals & Devices (SSD), Sétif, Algeria. IEEE: 1825-1830; ISBN 978-1-6654-7109-1
-
2022,
Vornicu S, Lunca E, Neagu BC, Baiceanu FC
2022 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: 723-726; ISBN 978-1-6654-8995-9
-
2022,
Eblen ML, Ramirez-Bettoni E, Wallace K
2022 IEEE IAS Electrical Safety Workshop (ESW), Jacksonville, FL, USA. IEEE: 1-7; ISBN 978-1-6654-7864-9