The following terms were included:
"specific absorption rate", "Spezifische Absorptionsrate", SAR, "specific energy absorption rate", 比エネルギー吸収率, 比吸収率
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2018,
Sheshaprasad N, Bhanu Prashanth SB
2018 International Conference on Networking, Embedded and Wireless Systems (ICNEWS), Bangalore, India. IEEE: 1-5.; ISBN 978-1-5386-7950-0
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2018,
Santini T, Zhao Y, Wood S, Krishnamurthy N, Kim J, Farhat N, Alkhateeb S, Martins T, Koo M, Zhao T, Aizenstein HJ, Ibrahim TS
PLoS One 13 (11): e0206127
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2018,
Manoufali M, Naqvi SAR, Abbosh AM
IEEE J Electromagn RF Microw Med Biol 2 (2): 79 - 86
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2018,
Wen D, Hao Y, Munoz MO, Wang H, Zhou H
IEEE Trans Antennas Propag 66 (1): 96 - 104
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2018,
Lan J, Hong T, Liang X, Du G
Prog Electromagn Res M 63: 71-81
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International Telecommunication Union (ITU),
ITU-T Recommendations K-Series, Supplement 13 (05/2018): 1-30
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Histol Histopathol 33 (5): 463-473
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2018,
Rasic P, Skiljo M, Blazevic Z, Doric V, Poljak D
2018 3rd International Conference on Smart and Sustainable Technologies (SpliTech), Split, Croatia. IEEE: pp. 1-6; ISBN 978-1-5386-6296-0
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2018,
Mortazavi SMJ, Mortazavi SAR, Paknahad M
J Biomed Phys Eng 8 (1): 151-152
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2018,
Michalowska J, Tofil A, Jozwik J, Pytka J, Budzynski P, Korzeniewska E
2018 IEEE 4th International Symposium on Wireless Systems within the International Conferences on Intelligent Data Acquisition and Advanced Computing Systems (IDAACS-SWS), Lviv, Ukraine. IEEE: pp. 162-165; ISBN 978-1-5386-7588-5
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2018,
Ashyap AYI, Dahlan SH, Abidin ZZ, Majid HA, Seman FC, Ngu X, Cholan NA
2018 IEEE International RF and Microwave Conference (RFM), Penang, Malaysia. IEEE: pp. 69-72; ISBN 978-1-5386-6721-7
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2018,
Faisal MMA, Mortuza MG, Alam T
2018 International Conference on Innovations in Science, Engineering and Technology (ICISET), Chittagong, Bangladesh. IEEE: pp. 423-426; ISBN 978-1-5386-8525-9
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2018,
Vaidya MV, Lazar M, Deniz CM, Haemer GG, Chen G, Bruno M, Sodickson DK, Lattanzi R, Collins CM
J Magn Reson Imaging 48 (2): 431-440
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2018,
Ishii N, Shimizu Y, Nagaoka T, Watanabe S
2018 IEEE International Workshop on Electromagnetics:Applications and Student Innovation Competition (iWEM), Nagoya, Japan. IEEE: pp. 1-2; ISBN 978-1-5386-4835-3
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2018,
Verma S, Keshri GK, Sharma M, Mani KV, Karmakar S, Chauhan S, Gupta A
2018 IEEE International Microwave Biomedical Conference (IMBioC), Philadelphia, PA, USA. IEEE: pp. 175-177; ISBN 978-1-5386-5919-9
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2018,
Kosta P, Paknahad J, Rodríguez ESG, Loizos K, Roy A, Talbot N, Seidman S, Datta P, Dai R, Pollack B, Greenberg R, Lazzi G
IEEE J Electromagn RF Microw Med Biol 2 (1): 56 - 63
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2018,
Wang M, Yang Z, Wu J, Bao J, Liu J, Cai L, Dang T, Zheng H, Li E
IEEE Trans Antennas Propag 66 (6): 3076 - 3086
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2018,
Ali IH, Hamd HI, Abdalla AI
2018 Advances in Science and Engineering Technology International Conferences (ASET), Dubai, Sharjah, Abu Dhabi, United Arab Emirates. IEEE: pp. 1-5; ISBN 978-1-5386-2400-5
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2018,
Chiaramello E, Parazzini M, Fiocchi S, Bonato M, Ravazzani P, Wiart J
2018 2nd URSI Atlantic Radio Science Meeting (AT-RASC), Gran Canaria, Spain. IEEE: pp. 1-4; ISBN 978-1-5386-3764-7
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2018,
Haridim M, Hilly O, Levi L, Lesnik R, Milgrom B
2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO), Reykjavik, Iceland. IEEE: pp. 1-3; ISBN 978-1-5386-5205-3
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2018,
Belrhiti L, Riouch F, Tribak A, Terhzaz J, Bouyahyaoui A, Sanchez AM
2018 6th International Conference on Multimedia Computing and Systems (ICMCS), Rabat, Morocco. IEEE: pp. 1-6; ISBN 978-1-5386-6221-2
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2018,
Taguchi K, Laakso I, Aga K, Hirata A, Diao Y, Chakarothai J, Kashiwa T
IEEE Access 6: 70186 - 70196
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2018 Open Innovations Conference (OI), Johannesburg, South Africa. IEEE: pp. 170-175; ISBN 978-1-5386-5319-7
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2018,
Bejenaru O, Lazarescu C, Vornicu S, David V
2018 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: pp. 1004-1009; ISBN 978-1-5386-5063-9
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2018,
Mellita RA, Chandu DS, Karthikeyan SS
2018 International Conference on Signal Processing and Communications (SPCOM), Bangalore, India. IEEE: pp. 110-114; ISBN 978-1-5386-3822-4