The following terms were included:
"touch current", Berührungsstrom, Kontaktstrom, 接触電流
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2020,
Burns JM, Kamykowski MG, Moreno JA, Jirjis MB
J Forensic Sci 65 (1): 144-153
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2020,
Preuss V, Vennemann B, Klintschar M
Int J Legal Med 134 (5): 1785-1790
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2020,
Reddy DP, Earan SK, Kuppusamy K
Indian Pediatr 57 (1): 76-77
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2020,
Shwehdi MH, Alaqil MA, Raja Mohamed S
IEEE Access 8: 3710-3717
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2020,
Roshanzamir S, Keshavarzi E
Burns 46 (2): 394-399
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2020,
Nizhu LN, Hasan MJ, Rabbani R
Trauma Case Rep 25: 100267
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2020,
Gentile G, Andreola S, Bailo P, Boracchi M, Fociani P, Piccinini A, Zoja R
J Forensic Sci 65 (3): 840-845
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2020,
Thinley P, Norbu T, Rajaratnam R, Vernes K, Dhendup P, Tenzin J, Choki K, Wangchuk S, Wangchuk T, Wangdi S, Chhetri DB, Powrel RB, Dorji K, Rinchen K, Dorji N
Primates 61 (2): 257-266
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2020,
Jacob S, Landolfo KP, El-Sayed Ahmed MM, Thomas M, Makey IA, Pham SM
J Card Surg 35 (2): 488-491
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2020,
Fronczek J, Byard RW
Med Sci Law 60 (1): 16-18
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Zentralbl Chir 145 (6): 519-520
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2020,
Pereira AABG, Dias B, Castro SI, Landi MFA, Melo CB, Wilson TM, Costa GRT, Passos PHO, Romano AP, Szabó MPJ, Castro MB
Primates 61 (2): 321-329
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2020,
Ateriya N, Meshram VP, Kanchan T, Saraf A, Shekhawat RS, Malik S
J Forensic Sci 65 (1): 318-322
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2020,
Stockly OR, Wolfe AE, Espinoza LF, Simko LC, Kowalske K, Carrougher GJ, Gibran N, Bamer AM, Meyer W, Rosenberg M, Rosenberg L, Kazis LE, Ryan CM, Schneider JC
Burns 46 (2): 352-359
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2020,
Wallner C, Houschyar KS, Drysch M, Lehnhardt M, Behr B
Zentralbl Chir 145 (6): 514-518
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2020,
Bunke C, Hashikawa AN, Mitra A
Ann Emerg Med 75 (1): 90-92
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2020,
Wasilewski J, Parol M, Jakubowski J
IEEE Transactions on Power Delivery 35 (2): 600 - 608
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2020,
Dechent D, Emonds T, Stunder D, Schmiedchen K, Kraus T, Driessen S
Burns 46 (2): 267-278
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2019,
Araneo R, Dehghanian P, Mitolo M
IEEE Trans Ind Appl 55 (6): 5613-5620
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2019,
Mukhtar N, Kantsi AS
Humanities and Social Science Research 2 (3): 26-36
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2019,
Wang C, Liang X, Freschi F
2019 IEEE Industry Applications Society Annual Meeting, Baltimore, MD, USA. IEEE: pp. 1-8; ISBN 978-1-5386-4540-6
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2019 International Multi-Conference on Industrial Engineering and Modern Technologies (FarEastCon), Vladivostok, Russia. IEEE: pp. 1-4; ISBN 978-1-7281-0062-3
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2019,
Bird R, Naji S, Vowles B, Shaw A, Martin NA
Trauma 21 (4): 317-320
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2019 2nd World Conference on Mechanical Engineering and Intelligent Manufacturing (WCMEIM), Shanghai, China. IEEE: pp. 59-63; ISBN 978-1-7281-5046-8
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2019 IEEE Aerospace Conference, Big Sky, MT, USA. IEEE: pp. 1-6; ISBN 978-1-5386-6855-9