The following terms were included:
国際非電離放射線防護委員会, "International Commission on Non-Ionizing Radiation Protection", IRPA/INIRC, ICNIRP, 国際放射線防護学会/国際非電離放射線委員会
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2018,
Tarao H, Takei A, Hayashi N, Isaka K
Electron Commun Jpn 101 (10): 3-10
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2018,
Nassiri P, Monazzam MR, Hosseyni SA, Azam K, Shalkouhi PJ
Environ Eng Manag J 17 (8): 1825-1830
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2018,
Martim HC, Vilarinho LO
Rev Soldag Insp 23 (2): 292-305
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2018,
Aga K, Hirata A, Laakso I, Tarao H, Diao Y, Ito T, Sekiba Y, Yamazaki K
IEEE Access 6: 70964-70973
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2018,
Li C, Lin J, Lei J, Wu T, Qi D, Chen R
2018 12th International Symposium on Antennas, Propagation and EM Theory (ISAPE), Hangzhou, China. IEEE: pp. 1-4; ISBN 978-1-5386-7303-4
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2018,
Harimurugan D, Punekar GS
IEEE Transactions on Power Delivery 33 (6): 3147-3154
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2018,
Sheshaprasad N, Bhanu Prashanth SB
2018 International Conference on Networking, Embedded and Wireless Systems (ICNEWS), Bangalore, India. IEEE: 1-5.; ISBN 978-1-5386-7950-0
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International Telecommunication Union (ITU),
ITU-T Recommendations K-Series, K.91 Supplement 4 (09/2018): 1-66
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International Telecommunication Union (ITU),
ITU-T Recommendations K-Series, K.52 (01/2018): 1-48
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2018,
Kosta P, Paknahad J, Rodríguez ESG, Loizos K, Roy A, Talbot N, Seidman S, Datta P, Dai R, Pollack B, Greenberg R, Lazzi G
IEEE J Electromagn RF Microw Med Biol 2 (1): 56 - 63
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2018,
Wang M, Yang Z, Wu J, Bao J, Liu J, Cai L, Dang T, Zheng H, Li E
IEEE Trans Antennas Propag 66 (6): 3076 - 3086
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2018,
Ali IH, Hamd HI, Abdalla AI
2018 Advances in Science and Engineering Technology International Conferences (ASET), Dubai, Sharjah, Abu Dhabi, United Arab Emirates. IEEE: pp. 1-5; ISBN 978-1-5386-2400-5
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2018,
Salam MA, Wen F, Ismit H, Rahman QM, Hasan S
2018 5th International Conference on Electrical and Electronic Engineering (ICEEE), Istanbul, Turkey. IEEE: pp. 293-296; ISBN 978-1-5386-6393-6
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2018,
Sadamitsu S, Leung SW, Lo WK, Sun WN
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: pp. 28-31; ISBN 978-1-5090-3955-5
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2018,
Chiaramello E, Parazzini M, Fiocchi S, Bonato M, Ravazzani P, Wiart J
2018 2nd URSI Atlantic Radio Science Meeting (AT-RASC), Gran Canaria, Spain. IEEE: pp. 1-4; ISBN 978-1-5386-3764-7
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2018,
Sato K, Tsukahara T, Kamimura Y
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Amsterdam, Netherlands. IEEE: pp. 506-509; ISBN 978-1-4673-9699-8
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2018,
Kamimura Y, Inagaki S, Wake K
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Amsterdam, Netherlands. IEEE: pp. 855-859; ISBN 978-1-4673-9699-8
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2018,
Piper S, Ball L, Mandziuk M
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI), Long Beach, CA, USA. IEEE: pp. 448-453; ISBN 978-1-5386-6622-7
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2018,
Haridim M, Hilly O, Levi L, Lesnik R, Milgrom B
2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO), Reykjavik, Iceland. IEEE: pp. 1-3; ISBN 978-1-5386-5205-3
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2018,
Korzeniewska E, Krawczyk A, Lada-Tondyra E
2018 Applications of Electromagnetics in Modern Techniques and Medicine (PTZE), Racławice, Poland. IEEE: pp. 125-128; ISBN 978-1-5386-6937-2
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2018,
Belrhiti L, Riouch F, Tribak A, Terhzaz J, Bouyahyaoui A, Sanchez AM
2018 6th International Conference on Multimedia Computing and Systems (ICMCS), Rabat, Morocco. IEEE: pp. 1-6; ISBN 978-1-5386-6221-2
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2018,
Periyasamy M, Dhanasekaran R, Mahendran G
2018 International Conference on Communication and Signal Processing (ICCSP), Chennai, India. IEEE: pp. 906-910; ISBN 978-1-5386-3522-3
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2018,
Stam R, Karipidis K, Abramowicz J, D'Inzeo G, Green A, Miller S, Okuno T, Toivo T
2018 EMF-Med 1st World Conference on Biomedical Applications of Electromagnetic Fields (EMF-Med), Split, Croatia. IEEE: pp. 1-2; ISBN 978-1-5386-5922-9
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2018,
Taguchi K, Laakso I, Aga K, Hirata A, Diao Y, Chakarothai J, Kashiwa T
IEEE Access 6: 70186 - 70196
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2018 Open Innovations Conference (OI), Johannesburg, South Africa. IEEE: pp. 170-175; ISBN 978-1-5386-5319-7