2017 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), Shanghai, China. IEEE: 174-177; ISBN 978-1-5386-1082-4
2017,
Wang P, Liu J, Yang Y, Zhai M, Shao X, Yan Z, Zhang X, Wu Y, Cao L, Sui B, Luo E, Jing D