The following terms were included:
cataract, "Grauer Star", Katarakt, 白内障
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2020,
Modenese A, Gobba F
2020 IEEE International Conference on Environment and Electrical Engineering and 2020 IEEE Industrial and Commercial Power Systems Europe (EEEIC / I&CPS Europe), Madrid, Spain. IEEE: 1-6; ISBN 978-1-7281-7456-3
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2000,
D’Andrea JA, Chalfin S
Klauenberg BJ, Miklavčič D (eds.): Radio Frequency Radiation Dosimetry and Its Relationship to the Biological Effects of Electromagnetic Fields. NATO Science Series, volume 82; Springer, Dordrecht; 395-402; ISBN 978-0-7923-6405-4
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National Radiological Protection Board (NRPB),
Documents of the NRPB, Volume 5 No.2: 1-81
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1977,
Moss CE, Murray WE, Parr WH, Messite J, Karches GJ
U.S. Department of Health, Education, and Welfare (HEW), U.S. Public Health Service (PHS), Centers for Disease Control and Prevention (CDC), National Institute for Occupational Safety and Health (NIOSH),
DHEW (NIOSH) Publication No. 78-129: 1-27
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1973,
Kramar P, Emery AF, Lin JC, Guy AW
1973 IEEE G-MTT International Microwave Symposium, Boulder, CO, USA. IEEE: 265-267
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U.S. Department of Health, Education, and Welfare (HEW), U.S. Public Health Service (PHS), Food and Drug Administration (FDA), Bureau of Radiological Health (BRH),
DHEW Publication No. (FDA) 73-8031 (BRH/DBE 73-3): 1-13
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Electronic Product Radiation and the Health Physicist: Fourth Annual Midyear Topical Symposium, Health Physics Society, Louisville, KY. BRH/DEP 70-26; U.S. Department of Health, Education, and Welfare (HEW), U.S. Public Health Service (PHS), Bureau of Radiological Health: 111-140
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Cleary SF (ed.): Biological Effects and Health Implications of Microwave Radiation: Symposium Proceedings Richmond, Virginia. BRH/DBE 70-2; U.S. Department of Health, Education, and Welfare (HEW), Public Health Service (PHS), Bureau of Radiological Health (BRH)), Rockville, Maryland; 59-65
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1961,
Carpenter RL, Biddle DK, van Ummersen CA
Thomas CC, International Federation for Medical Electronics (eds.): Proceedings of the Third International Conference on Medical Electronics, London,1960. The Institution of Electrical Engineers (IEE), Springfield, IL; 401-408
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1961,
Zaret MM, Cleary S, Pasternack B, Eisenbud M
RADC-TN-61-226: 1-115