The following terms were included:
dielectric, dielektrisch, 誘電の、誘電体
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2023,
Deepthy GS, Nesasudha M
2023 Second International Conference on Electrical, Electronics, Information and Communication Technologies (ICEEICT), Trichirappalli, India. IEEE: 1-7; ISBN 9798350397642
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2023,
Hengroemyat Y, Kaewthai T, Akkaraekthalin P, Thaiwirot W
2023 20th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON), Nakhon Phanom, Thailand. IEEE: 1-4; ISBN 9798350310474
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2023,
Tarade J, Pandit Khot U
2023 11th International Conference on Emerging Trends in Engineering & Technology - Signal and Information Processing (ICETET - SIP), Nagpur, India. IEEE: 1-7; ISBN 9798350321999
-
2023,
Prakash S, Kumar K, Arulaalan M, Kalaivanan M
2023 2nd International Conference on Smart Technologies and Systems for Next Generation Computing (ICSTSN), Villupuram, India. IEEE: 1-5; ISBN 9798350348019
-
2023,
González JF, Ramírez GA, Araque JL
2023 17th European Conference on Antennas and Propagation (EuCAP), Florence, Italy. IEEE: 1-5; ISBN 978-1-6654-7541-9
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2023,
Chellathurai AS, Sugumar D, Kishor T, Jacob LS, Aldrin AA, Shamith M
2023 4th International Conference on Signal Processing and Communication (ICSPC), Coimbatore, India. IEEE: 334-338; ISBN 9798350300789
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2023,
Gupta J, Das P, Bhowmik T, Bhattacharjee R, Sikdar D
2023 National Conference on Communications (NCC), Guwahati, India. IEEE: 1-4; ISBN 978-1-6654-5626-5
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2023,
Kakaraparty K, Mahbub I
2023 United States National Committee of URSI National Radio Science Meeting (USNC-URSI NRSM), Boulder, CO, USA. IEEE: 141-142; ISBN 978-1-6654-7642-3
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2023,
Qureshi MRA, Alfadhl Y, Chen X, Ur Rehman M
Ur Rehman M, Jamshed MA (eds.): Low Electromagnetic Field Exposure Wireless Devices: Fundamentals and Recent Advances. Wiley-IEEE Press; 77-114; ISBN 978-1-119-90916-3
-
2023,
Qureshi MRA, Alfadhl Y, Chen X
Ur Rehman M, Jamshed MA (eds.): Low Electromagnetic Field Exposure Wireless Devices: Fundamentals and Recent Advances. Wiley-IEEE Press; 49-75; ISBN 978-1-119-90916-3