The following terms were included:
electromagnetic, elektromagnetisch, 電磁気の
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2017,
Griguer H, Tentzeris MM, Nauroze A, Drissi M
2017 XXXIInd General Assembly and Scientific Symposium of the International Union of Radio Science (URSI GASS), Montreal, QC, Canada. IEEE: pp. 1-4; ISBN 978-90-825987-0-4
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2017,
Ebadi-Shahrivar A, Ren J, Hochwald BM, Fay P, Jin JM, Love DJ
2017 IEEE International Symposium on Antennas and Propagation & USNC/URSI National Radio Science Meeting, San Diego, CA, USA. IEEE: pp. 1419-1420; ISBN 978-1-5386-0898-2
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2017,
Yavolovskaya E, Gabriadze G, Chiqovani G, Jobava R
2017 XXIInd International Seminar/Workshop on Direct and Inverse Problems of Electromagnetic and Acoustic Wave Theory (DIPED), Dnipro, Ukraine. IEEE: pp. 183-186; ISBN 978-1-5090-0605-2
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2017,
Staigvila G, Novickij V
2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE), Riga, Latvia. IEEE: pp. 1-3; ISBN 978-1-5386-4138-5
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2017,
Saito K, Akiyama R, Nagaoka T, Watanabe S
2017 International Workshop on Antenna Technology: Small Antennas, Innovative Structures, and Applications (iWAT), Athens, Greece. IEEE: pp. 152-153; ISBN 978-1-5090-5178-6
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2017,
Kisel NN, Cheremisov VA, Kisel DV
2017 Progress In Electromagnetics Research Symposium - Spring (PIERS), St. Petersburg, Russia. IEEE: pp. 3433-3438; ISBN 978-1-5090-6270-6
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2017,
Jovicic K, Koprivica M, Kuzle I, Neskovic N, Neskovic A
[2017 25th Telecommunication Forum (TELFOR)], Belgrade, Serbia. IEEE: pp. 1-2; ISBN 978-1-5386-3074-7
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2017,
Hanzelka M, Dan J, Fiala P, Drexler P, Holcner V, Dohnal P
2017 Progress in Electromagnetics Research Symposium - Fall (PIERS - FALL), Singapore. IEEE: pp. 966-969; ISBN 978-1-5386-1211-8
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2017,
Gercek C, Magne I, Kourtiche D, Schmitt P, Roth P, Nadi M, Souques M
2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Angers, France. IEEE: pp. 1-5; ISBN 978-1-5386-0689-6
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2017,
Gil I, Fernández-García R
2017 Progress In Electromagnetics Research Symposium - Spring (PIERS), St. Petersburg, Russia. IEEE: pp. 655-659; ISBN 978-1-5090-6270-6