-
2020,
Betta G, Cerro G, Miele G, D’Amata MS, Capriglione D
2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), Dubrovnik, Croatia. IEEE: 1-6; ISBN 978-1-7281-4461-0
-
2020 Ural Symposium on Biomedical Engineering, Radioelectronics and Information Technology (USBEREIT), Yekaterinburg, Russia. IEEE: 147-151; ISBN 978-1-7281-3166-5
-
2020 IEEE 9th Power India International Conference (PIICON), Sonepat, India. IEEE: 1-5; ISBN 978-1-7281-6665-0
-
2020,
Kundu A, Gupta B, Patra K, Mallick AI
2020 IEEE Calcutta Conference (CALCON), Kolkata, India. IEEE: 132-136; ISBN 978-1-7281-5362-9
-
Food and Drug Administration (FDA),
Review: 1-112
-
2019,
Islam T, Begum HA, Rahman MA, Ahsan T, Alam MS, Alam T, Sobuz MS, Islam MT
2018 International Conference on Innovations in Science, Engineering and Technology (ICISET), Chittagong, Bangladesh. IEEE: 447-450; ISBN 978-1-5386-8525-9
-
2019 IEEE 3rd International Electrical and Energy Conference (CIEEC), Beijing, China. IEEE: 1507-1512; ISBN 978-1-7281-1676-1
-
2019,
Gökçek-Saraç Ç, Özen Ş, Derin N
2019 PhotonIcs & Electromagnetics Research Symposium - Spring (PIERS-Spring), Rome, Italy. IEEE: 1439-1444; ISBN 978-1-7281-3404-8
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2019,
Gómez-Pulido JM, Domínguez González-Seco EP, Gómez D
[2019 7th International Engineering, Sciences and Technology Conference (IESTEC)], Panama, Panama. IEEE: 144-148; ISBN 978-1-7281-1692-1
-
2019,
Mahendra A, Basari, Rahardjo ET
2019 IEEE Conference on Antenna Measurements & Applications (CAMA), Kuta, Bali, Indonesia. IEEE: 1-3; ISBN 978-1-7281-2397-4
-
2019 International Multi-Conference on Engineering, Computer and Information Sciences (SIBIRCON), Novosibirsk, Russia. IEEE: 199-202; ISBN 978-1-7281-4402-3
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2019,
Takasaka C, Saito K, Takahashi M, Nagaoka T, Watanabe S
2019 International Symposium on Antennas and Propagation (ISAP), Xi'an, China. IEEE: 1-3; ISBN 978-1-7281-5113-7
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2019,
Mohammad M, Pries J, Onar O, Anwar S, Galigekere VP, Su GJ, Wilkins J
2019 IEEE Energy Conversion Congress and Exposition (ECCE), Baltimore, MD, USA. IEEE: 5733-5739; ISBN 978-1-7281-0396-9
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2019,
Rathebe PC, Modisane DS, Rampedi MB, Biddesay-Manila S, Mbonane TP
2019 Open Innovations (OI), Cape Town, South Africa. IEEE: 219-221; ISBN 978-1-7281-3465-9
-
2019,
Matković A, Šarolić A
2019 International Conference on Software, Telecommunications and Computer Networks (SoftCOM), Split, Croatia. IEEE: 1-4; ISBN 978-1-7281-3711-7
-
2019,
Mondal SP, Padmini TN
2019 International Conference on Vision Towards Emerging Trends in Communication and Networking (ViTECoN), Vellore, India. IEEE: 1-4; ISBN 978-1-5386-9354-4
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2019,
Ahmed S, Mehmood A, Sydänheimo L, Ukkonen L, Björninen T
2019 IEEE International Conference on RFID Technology and Applications (RFID-TA), Pisa, Italy. IEEE: 231-235; ISBN 978-1-7281-0590-1
-
2019,
Gryz K, Karpowicz J
2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Barcelona, Spain. IEEE: 1030-1033; ISBN 978-1-7281-0595-6
-
2019,
Bechet AC, Helbet R, Miclaus S, Bouleanu I, Sarbu A, Bechet P
2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Barcelona, Spain. IEEE: 1025-1029; ISBN 978-1-7281-0595-6
-
French Agency for Food, Environmental and Occupational Health & Safety (ANSES),
ANSES OPNION, Request No 2017-SA-0229: 1-16
-
2019,
Sharma P, Yadav S, Kumar J
2019 6th International Conference on Signal Processing and Integrated Networks (SPIN), Noida, India. IEEE: 120-122; ISBN 978-1-7281-1381-4
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2019,
Danker-Hopfe H, Dorn H, Eggert T, Sauter C
Federal Office for Radiation Protection (BfS),
Ressortforschungsberichte zur kerntechnischen Sicherheit und zum Strahlenschutz, BfS-RESFOR-143/19: 1-226
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2019,
Bernieri A, Betta G, Cerro G, Miele G, Capriglione D
2019 IEEE International Symposium on Measurements & Networking (M&N), Catania, Italy. IEEE: 1-6; ISBN 978-1-7281-1274-9
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2019,
Beehet AC, Helbet R, Miclaus S, Bouleanu I, Sarbu A, Bechet P
2019 8th International Conference on Modern Power Systems (MPS), Cluj Napoca, Romania. IEEE: 1-4; ISBN 978-1-7281-0751-6
-
2019,
Rathebe PC, Mbonane TP
2018 IEEE 4th Global Electromagnetic Compatibility Conference (GEMCCON), Stellenbosch, South Africa. IEEE: 1-3; ISBN 978-1-5386-5729-4