-
2018,
Acharya R, Kumar D, Mathur G
Janyani V, Tiwari M, Singh G, Minzioni P (eds.): Optical and Wireless Technologies. Lecture Notes in Electrical Engineering, volume 472; Springer, Singapore; 497-505; ISBN 978-981-10-7394-6
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2018,
Zradzinski P, Karpowicz J, Gryz G
2018 EMF-Med 1st World Conference on Biomedical Applications of Electromagnetic Fields (EMF-Med), Split, Croatia. IEEE: 1-2; ISBN 978-1-5386-5922-9
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2018,
Beygi M, Mumcu G, Saddow SE
SoutheastCon 2018, St. Petersburg, FL, USA. IEEE: 1-2; ISBN 978-1-5386-6134-5
-
International Telecommunication Union (ITU),
ITU-T Recommendations K-Series, Supplement 13 (05/2018): 1-30
-
2018,
Sen R, Sarkar AK, Mandal AK, Paul LC
2018 International Conference on Innovation in Engineering and Technology (ICIET), Dhaka, Bangladesh. IEEE: 1-5; ISBN 978-1-5386-5230-5
-
2018,
Sadamitsu S, Leung SW, Lo WK, Sun WN
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: 28-31; ISBN 978-1-5090-3955-5
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2018,
Periyasamy M, Dhanasekaran R, Mahendran G
2018 International Conference on Communication and Signal Processing (ICCSP), Chennai, India. IEEE: 906-910; ISBN 978-1-5386-3522-3
-
2018 Open Innovations Conference (OI), Johannesburg, South Africa. IEEE: 170-175; ISBN 978-1-5386-5319-7
-
2018,
Pinnamraju A, Pukkalla SK, Valluri RL
2018 15th International Conference on ElectroMagnetic Interference & Compatibility (INCEMIC), Bengaluru, India. IEEE: 1-4; ISBN 978-1-7281-1358-6
-
2018 15th International Conference on ElectroMagnetic Interference & Compatibility (INCEMIC), Bengaluru, India. IEEE: 1-4; ISBN 978-1-7281-1358-6
-
2018,
Houran MA, Yang X, Chen W, Samizadeh M
2018 International Power Electronics Conference (IPEC-Niigata 2018 -ECCE Asia), Niigata, Japan. IEEE: 1062-1066; ISBN 978-1-5386-4190-3
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2018,
Hirtl R, Bodewein L, Schmiedchen K, Dechent D, Stunder D, Gräfrath D, Winter L, Kraus T, Driessen S, Schmid G
Federal Office for Radiation Protection (BfS),
Ressortforschungsberichte zur kerntechnischen Sicherheit und zum Strahlenschutz, BfS-RESFOR-139/18: 1-198
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2018,
Kurta E, Kovačević Ž, Gurbeta L, Badnjević A
2018 7th Mediterranean Conference on Embedded Computing (MECO), Budva, Montenegro. IEEE: 1-4; ISBN 978-1-5386-5684-6
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2017,
Karpowicz J, Miclaus S, Gryz K
2017 E-Health and Bioengineering Conference (EHB), Sinaia, Romania. IEEE: 607-610; ISBN 978-1-5386-1514-0
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2017 IEEE International Symposium on Antennas and Propagation & USNC/URSI National Radio Science Meeting, San Diego, CA, USA. IEEE: 1009-1010; ISBN 978-1-5386-0898-2
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2017,
Rittong B, Sirisumrannukul S
2017 14th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON), Phuket, Thailand. IEEE: 361-364; ISBN 978-1-5386-0450-2
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German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE),
DIN EN 50527-2-1 VDE 0848-527-2-1:2017-12
-
German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE),
DIN EN 50527-1 VDE 0848-527-1:2017-12
-
2017,
Saito K, Akiyama R, Nagaoka T, Watanabe S
2017 International Workshop on Antenna Technology: Small Antennas, Innovative Structures, and Applications (iWAT), Athens, Greece. IEEE: 152-153; ISBN 978-1-5090-5178-6
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2017,
Elnail KEI, Huang X, Tan L
2017 China International Electrical and Energy Conference (CIEEC), Beijing, China. IEEE: 750-753; ISBN 978-1-5090-6277-5
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2017,
Cosmas J, Kapovits Á
2017 Global Wireless Summit (GWS), Cape Town, South Africa. IEEE: 257-261; ISBN 978-1-5386-1099-2
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2017,
Cheikh M, Vassilieff Y, Fortes A, Benbouhout R, Foligné H
2017 Progress in Electromagnetics Research Symposium - Fall (PIERS - FALL), Singapore. IEEE, Singapore, Singapore: 1048-1054; ISBN 978-1-5386-1211-8
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2017,
Okumura T, Iguchi E, Kojima K
2017 IEEE 6th Global Conference on Consumer Electronics (GCCE), Nagoya, Japan. IEEE; ISBN 978-1-5090-4046-9
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2017,
Hikage T, Yamagishi M, Shindo K, Nojima T
2017 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), Seoul, Korea (South). IEEE; ISBN 978-1-5386-3913-9
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2016,
Koppel T, Haldre H, Shishkin A, Hussainova I, Toropovs N, Mironovs V, Tint P
2016 57th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), Riga, Latvia. IEEE: 1-6; ISBN 978-1-5090-3732-2