-
2022,
Meenu L, Aiswarya S, Menon SK, Menon KU
2022 URSI Regional Conference on Radio Science (USRI-RCRS), Indore, India. IEEE: 1-4; ISBN 978-1-6654-5359-2
-
2022,
Więcek DP, Wroński JW
Proceedings of the 37th ACM/SIGAPP Symposium on Applied Computing, Brno, Czech Republic, (SAC '22). Association for Computing Machinery, New York, NY, USA: 1979-1982; ISBN 978-1-4503-8713-2
-
2022 IEEE International RF and Microwave Conference (RFM), Kuala Lumpur, Malaysia. IEEE: 1-4; ISBN 978-1-6654-8978-2
-
EMIE 2022; The 2nd International Conference on Electronic Materials and Information Engineering, Hangzhou, China. VDE: 1-6; ISBN 978-3-8007-5961-3
-
Panagopoulos DJ (ed.): CRC Press, Boca Raton; ISBN 978-1-032-06175-7
-
2022 International Conference on Computing, Communication, and Intelligent Systems (ICCCIS), Greater Noida, India. IEEE: 383-388; ISBN 978-1-6654-6201-3
-
2022,
Mulot M, Kroeber T, Gossner M, Fröhlich J
Bericht im Auftrag des Bundesamts für Umwelt (BAFU): 1-87
-
2022,
Kim D, Kim M, Lee S, Lee Y, Kim Y
2022 9th International Conference on Condition Monitoring and Diagnosis (CMD), Kitakyushu, Japan. IEEE: 687-690; ISBN 978-1-6654-7015-5
-
2022,
Asha Banu SM, Niresh Kumar K, Mohamed Faizal M, Murugananda Sri Sabari Vasan S
2022 4th International Conference on Inventive Research in Computing Applications (ICIRCA), Coimbatore, India. IEEE: 1-8; ISBN 978-1-6654-9708-4
-
2022,
Bridova I, Moravcik M
2022 20th International Conference on Emerging eLearning Technologies and Applications (ICETA), Stary Smokovec, Slovakia. IEEE: 73-78; ISBN 9798350320343
-
2022,
Baaken D, Erdmann F, Olsson A, Onyije FM, Schüz J, Wollschläger D
Federal Office for Radiation Protection (BfS),
Ressortforschungsberichte zum Strahlenschutz, BfS-RESFOR-206/22: 1-73
-
2022,
Silue D, Choubani F, Labidi M
2022 18th International Conference on Wireless and Mobile Computing, Networking and Communications (WiMob), Thessaloniki, Greece. IEEE: 278-283; ISBN 978-1-6654-6976-0
-
2022,
Uthayakumar U, Jayaweera Y
2022 IEEE Symposium on Wireless Technology & Applications (ISWTA), Kuala Lumpur, Malaysia. IEEE: 62-67; ISBN 978-1-6654-8483-1
-
GSM Association (GSMA),
1-28
-
2022,
Shbanah M, Kovács TA
Kovács TA, Nyikes Z, Fürstner I (eds.): Security-Related Advanced Technologies in Critical Infrastructure Protection: Theoretical and Practical Approach. NATO Science for Peace and Security Series C: Environmental Security; Springer, Dordrecht; 161-167; ISBN 978-94-024-2176-7
-
2022,
Nath D, Goyal S, Pistorius S
2022 24th International Microwave and Radar Conference (MIKON), Gdansk, Poland. IEEE: 1-3; ISBN 978-1-6654-1106-6
-
2022 International Conference on Engineering & MIS (ICEMIS), Istanbul, Turkey. IEEE: 1-4; ISBN 978-1-6654-5437-7
-
2022,
Johansson M, Carlsson J
2022 International Symposium on Electromagnetic Compatibility – EMC Europe, Gothenburg, Sweden. IEEE: 137-140; ISBN 978-1-6654-0789-2
-
2022,
Djuric N, Kljajic D, Gavrilov T, Markovic Golubovic N, Djuric S
2022 IEEE International Symposium on Measurements & Networking (M&N), Padua, Italy. IEEE: 1-6; ISBN 978-1-6654-8363-6
-
2022,
Kakaraparty K, Mahbub I
2022 United States National Committee of URSI National Radio Science Meeting (USNC-URSI NRSM), Boulder, CO, USA. IEEE: 204-205; ISBN 978-1-6654-6501-4
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2022 IEEE USNC-URSI Radio Science Meeting (Joint with AP-S Symposium), Denver, CO, USA. IEEE: 40-41; ISBN 978-1-6654-3151-4
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2022 IEEE XXIX International Conference on Electronics, Electrical Engineering and Computing (INTERCON), Lima, Peru. IEEE: 1-4; ISBN 978-1-6654-8637-8
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2022,
Nourinovin S, Rahman MM, Philpott MP, Alomainy A
2022 IEEE International Symposium on Medical Measurements and Applications (MeMeA), Messina, Italy. IEEE: 1-5; ISBN 978-1-6654-8300-1
-
2022,
Ammar AM, Ellafi AY, Zerek AR
2022 IEEE 2nd International Maghreb Meeting of the Conference on Sciences and Techniques of Automatic Control and Computer Engineering (MI-STA), Sabratha, Libya. IEEE: 458-464; ISBN 978-1-6654-7919-6
-
2022,
Lin K, Xu X, Zhao T, Chen SE, Braxtan N, Cook D, Ward D
2022 IEEE Transportation Electrification Conference & Expo (ITEC), Anaheim, CA, USA. IEEE: 606-610; ISBN 978-1-6654-0561-4