2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI), Long Beach, CA, USA. IEEE: 448-453; ISBN 978-1-5386-6622-7
2017,
Souli MP, Klonos P, Fragopoulou AF, Mavragani IV, Pateras IS, Kostomitsopoulos N, Margaritis LH, Zoumpoulis P, Kaklamanis L, Kletsas D, Gorgoulis VG, Kyritsis A, Pissis P, Georgakilas AG