The following terms were included:
polarization, Polarisation, 偏波、分極
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2018,
Patwardhan R, Sonawane S, Harsh R, Gaikwad S
2018 International Conference On Advances in Communication and Computing Technology (ICACCT), Sangamner. IEEE: 616-618; ISBN 978-1-5386-0927-9
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2018,
Munhoz-Rojas PE, Segura-Salas CS, Costa AA, Martins R, Hoffmann-Neto J
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: 1267-1273; ISBN 978-1-5090-3955-5
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2017,
Griguer H, Tentzeris MM, Nauroze A, Drissi M
2017 XXXIInd General Assembly and Scientific Symposium of the International Union of Radio Science (URSI GASS), Montreal. IEEE, Montreal, Canada: 1-4; ISBN 978-90-825987-0-4
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2017,
Marques EG, Mendes AMS
2017 11th IEEE International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG), Cadiz, Spain. IEEE: 489-194; ISBN 978-1-5090-4964-6
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2017,
Cvetković M, Dodig H, Poljak D
2017 25th International Conference on Software, Telecommunications and Computer Networks (SoftCOM), Split, Croatia. IEEE; ISBN 978-953-290-078-1
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2017,
Smondrk M, Benova M, Psenakova Z
2017 18th International Conference on Computational Problems of Electrical Engineering (CPEE), Kutna Hora. IEEE, Kutna Hora, Czech Republic; ISBN 978-1-5386-1040-4
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2017,
Seo H, Kim HI, Jun SC
2017 39th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Jeju, Korea (South). IEEE: 1946-1949; ISBN 978-1-5090-2810-8
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2017,
Yadav S, Sharma MM, Jhanwar D, Garg M
2017 International Conference on Computer, Communications and Electronics (Comptelix), Jaipur. IEEE; ISBN 978-1-5090-4709-3
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2016,
Bhattacharjee S, Mitra M, Chaudhuri SRB
2016 IEEE MTT-S International Microwave and RF Conference (IMaRC), New Delhi, India. IEEE; ISBN 978-1-5090-4686-7
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2016,
Lucano E, Liberti M, Lloyd T, Apollonio F, Wedan S, Kainz W, Angelone LM
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE; ISBN 978-1-4577-0220-4