-
2020,
Salceanu A, Vornicu S, Lunca E, Istrate M
2020 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: 657-661; ISBN 978-1-7281-8127-1
-
2020,
Salceanu A, Vornicu S, Bordeianu DF, Neagu CD
2020 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: 674-679; ISBN 978-1-7281-8127-1
-
2020 IEEE 15th International Conference on Industrial and Information Systems (ICIIS), RUPNAGAR, India. IEEE: 567-570; ISBN 978-1-7281-8525-5
-
National Academies of Sciences, Engineering, and Medicine (NASEM),
1-76, ISBN 978-0-309-68137-7
-
2020,
Lee CY, Tang JY, Chen PJ, Jang LS, Chuang HL
2020 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan), Taoyuan, Taiwan. IEEE: 1-2; ISBN 978-1-7281-7400-6
-
2020,
Ishteyaq I, Masoodi IS, Muzaffar K
2020 IEEE Bangalore Humanitarian Technology Conference (B-HTC), Vijiyapur, India. IEEE: 1-4; ISBN 978-1-7281-8795-2
-
2020 IEEE REGION 10 CONFERENCE (TENCON), Osaka, Japan. IEEE: 128-133; ISBN 978-1-7281-8456-2
-
2020,
Savchenko V, Synyavskiy O, Dudnyk A, Nesvidomin A, Ramsh V, Bunko V
2020 IEEE KhPI Week on Advanced Technology (KhPIWeek), Kharkiv, Ukraine. IEEE: 193-198; ISBN 978-0-7381-4241-8
-
2020,
Liapatis O, Nikita KS
2020 IEEE 20th International Conference on Bioinformatics and Bioengineering (BIBE), Cincinnati, OH, USA. IEEE: 819-825; ISBN 978-1-7281-9575-9
-
U.S. Government Accountability Office (GOA),
GAO-21-26SP: 1-59
-
2020,
Health Council of the Netherlands
The Hague: Health Council of the Netherlands,
publication no. 2020/16e: 1-33
-
2020,
Kovalenko O, Kalinichenko S, Babich E, Kivva F, Roenko A, Antusheva T
2020 IEEE Ukrainian Microwave Week (UkrMW), Kharkiv, Ukraine. IEEE: 603-607; ISBN 978-1-7281-7314-6
-
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5580-7
-
2020,
Miwa K, Takenaka T, Hirata A
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5580-7
-
2020,
Bereta M, Teplan M, Chafai DE, Cifra M
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: 1-3; ISBN 978-1-7281-5690-3
-
2020,
Augé S, Tamra A, Rigal L, Lobjois V, Ducommun B, Dubuc D, Grenier K
2020 IEEE/MTT-S International Microwave Symposium (IMS), Los Angeles, CA, USA. IEEE: 508-511; ISBN 978-1-7281-6816-6
-
2020,
El-Hajj AM, Naous T
2020 IEEE 3rd 5G World Forum (5GWF), Bangalore, India. IEEE: 448-453; ISBN 978-1-7281-7300-9
-
2020,
Lau CI, Chen WH, Walsh V
Wang SJ, Lau CI (eds.): Update on Emerging Treatments for Migraine. Progress in Brain Research, volume 255; Elsevier, Amsterdam; 207-247; ISBN 978-0-12-821108-3
-
2020,
Tariq RU, Ye M, Cao Z, He Y
2020 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP), Suzhou, China. IEEE: 1-3; ISBN 978-1-7281-6065-8
-
2020,
Kohan M, Jakusova V, Jakus J, Zivcak J, Hudak R, Schnitzer M, Jancosek M, Ivankova J
2020 ELEKTRO, Taormina, Italy. IEEE: 1-5; ISBN 978-1-7281-7543-0
-
2020,
Lamberti P, Tucci V, Zeni O, Romeo S
2020 IEEE 20th Mediterranean Electrotechnical Conference ( MELECON), Palermo, Italy. IEEE: 411-414; ISBN 978-1-7281-5201-1
-
2020,
Akbar N, Yarossi M, Martinez-Gost M, Sommer MA, Dannhauer M, Rampersad S, Brooks D, Tunik E, Erdoğmuş D
PETRA '20: The 13th PErvasive Technologies Related to Assistive Environments Conference, Corfu Greece. Association for Computing Machinery: 101-106; ISBN 978-1-4503-7773-7
-
2020,
Garvanova M, Garvanov I, Borissova D
2020 21st International Symposium on Electrical Apparatus & Technologies (SIELA), Bourgas, Bulgaria. IEEE: 1-4; ISBN 978-1-7281-4347-7
-
2020,
Liu B, Guo L, Zhang J, Chen X, Huang J, Ma Y, Zhou L
2020 5th Asia Conference on Power and Electrical Engineering (ACPEE), Chengdu, China. IEEE: 1568-1572; ISBN 978-1-7281-5282-0
-
2020,
Zhang B, Carlson RB, Salisbury SD, Dickerson CC, Pennington TD, Walker LK, Dufek EJ
2020 IEEE Transportation Electrification Conference & Expo (ITEC), Chicago, IL, USA. IEEE: 844-850; ISBN 978-1-7281-4630-0