The following terms were included:
probability, Irrtumswahrscheinlichkeit, Wahrscheinlichkeit, 確率
-
2020,
Bonato M, Chiaramello E, Fiocchi S, Gallucci S, Dossi L, Tognola G, Ravazzani P, Parazzini M
2020 IEEE 20th Mediterranean Electrotechnical Conference ( MELECON), Palermo, Italy. IEEE: 429-433; ISBN 978-1-7281-5201-1
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German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE),
DIN EN 50527-2-2 VDE 0848-527-2-2:2019-11
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2019,
Aroke O, Doherty M, Esmaeili B
2019 IEEE IAS Electrical Safety Workshop (ESW), Jacksonville, FL, USA. IEEE: 1-7; ISBN 978-1-7281-0645-8
-
2019,
Hurtado-Jimenez J, Leon-Grande AM, Cabello-Garcia JR, Lara-Raya FR
2019 6th International Advanced Research Workshop on Transformers (ARWtr), Cordoba, Spain. IEEE: 99-104; ISBN 978-1-7281-0959-6
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2019,
Bonato M, Chiaramello E, Fiocchi S, Tognola G, Parazzini M, Ravazzani P
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: 6910-3913; ISBN 978-1-5386-1312-2
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2019,
Danker-Hopfe H, Dorn H, Eggert T, Sauter C
Federal Office for Radiation Protection (BfS),
Ressortforschungsberichte zur kerntechnischen Sicherheit und zum Strahlenschutz, BfS-RESFOR-143/19: 1-226
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Balas VE, Jain LC, Balas MM (eds.): Soft Computing Applications. SOFA 2016. Advances in Intelligent Systems and Computing, volume 633; Springer, Cham; 95-106; ISBN 978-3-319-62520-1
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2018,
Chiaramello E, Parazzini M, Fiocchi S, Bonato M, Ravazzani P, Wiart J
2018 2nd URSI Atlantic Radio Science Meeting (AT-RASC), Gran Canaria, Spain. IEEE: 1-4; ISBN 978-1-5386-3764-7
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2018,
Dai R, Zhao Y, Chen G, Dou W, Tian C, Wu X, He T
IEEE INFOCOM 2018 - IEEE Conference on Computer Communications, Honolulu, HI, USA. IEEE: 378-386; ISBN 978-1-5386-4129-3
-
German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE),
DIN EN 50527-2-1 VDE 0848-527-2-1:2017-12