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Cabré-Riera A, van Wel L, Liorni I, Koopman-Verhoeff ME, Imaz L, Ibarluzea J, Huss A, Wiart J, Vermeulen R, Joseph W, Capstick M, Vrijheid M, Cardis E, Röösli M, Eeftens M, Thielens A, Tiemeier H, Guxens M
2022 18th IEEE/ASME International Conference on Mechatronic and Embedded Systems and Applications (MESA), Taipei, Taiwan. IEEE: 1-6; ISBN 978-1-6654-5571-8