-
2018,
Aumann HM, Emanetoglu NW
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: 5121-5124; ISBN 978-1-5386-3647-3
-
International Organization for Standardization (ISO),
ISO/TS 10974:2018
-
2018,
Hutchison ZL, Sigray P, He H, Gill AB, King J, Gibson C
Bureau of Ocean Energy Management (U.S. Department of the Interior) (BOEM),
OCS Study BOEM 2018-003: 1-254
-
2018 9th International Conference on Ultrawideband and Ultrashort Impulse Signals (UWBUSIS), Odessa, Ukraine. IEEE: 69-73; ISBN 978-1-5386-2469-2
-
2018,
Della Valle E, Marracino P, Setti S, Cadossi R, Liberti M, Apollonio F
2018 2nd URSI Atlantic Radio Science Meeting (AT-RASC), Gran Canaria, Spain. IEEE: 1-3; ISBN 978-1-5386-3764-7
-
2018,
Cieslar G, Sowa P, Sieron K, Sieron A
2018 Baltic URSI Symposium (URSI), Poznan, Poland. IEEE: 5-6; ISBN 978-1-5386-1360-3
-
2018,
Gurhan H, Bruzón R, Xiong Y, Barnes F
2018 United States National Committee of URSI National Radio Science Meeting (USNC-URSI NRSM), Boulder, CO, USA. IEEE: 1-2; ISBN 978-1-5386-5031-8
-
2018,
Shkliarskyi V, Matiieshyn Y, Grytsay V, Smarkutskyi T, Shckorbatov Y
2018 14th International Conference on Advanced Trends in Radioelecrtronics, Telecommunications and Computer Engineering (TCSET), Lviv-Slavske, Ukraine. IEEE: 728-731; ISBN 978-1-5386-2557-6
-
2018,
Baracca P, Weber A, Wild T, Grangeat C
WSA 2018; 22nd International ITG Workshop on Smart Antennas, Bochum, Germany. VDE: 1-6; ISBN 978-3-8007-4541-8
-
2018,
Zhang N, Wang S, Wang S, Ning S
2018 International Applied Computational Electromagnetics Society Symposium - China (ACES), Beijing, China. IEEE: 1-2; ISBN 978-1-5386-7187-0
-
2018,
Zhu T, Wang S, Zhang N, Yan Y, Guo Z, Wang S, Wang S
2018 IEEE International Conference on High Voltage Engineering and Application (ICHVE), Athens, Greece. IEEE: 1-4; ISBN 978-1-5386-5087-5
-
2018,
Patwardhan R, Sonawane S, Harsh R, Gaikwad S
2018 International Conference On Advances in Communication and Computing Technology (ICACCT), Sangamner. IEEE: 616-618; ISBN 978-1-5386-0927-9
-
2018 International Power Electronics Conference (IPEC-Niigata 2018 -ECCE Asia), Niigata, Japan. IEEE: 2569-2575; ISBN 978-1-5386-4190-3
-
2018,
Galante A, Alecci M, Fantasia M, Rinaldiop C, Federici F, Franchi F
2018 IEEE International Symposium on Medical Measurements and Applications (MeMeA), Rome, Italy. IEEE: 1-5; ISBN 978-1-5386-3393-9
-
2018,
Sun W, He Y, Diao Y, Leung SW, Siu YM, Kong YC
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: 872-874; ISBN 978-1-5090-3955-5
-
2018,
Koh WJ, Moochhala SM
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: 518-522; ISBN 978-1-5090-3955-5
-
2018,
Malkemper EP, Tscheulin T, Vanbergen AJ, Vian A, Balian E, Goudeseune L
1-28
-
2018,
SSM’s Scientific Council on Electromagnetic Fields
Swedish Radiation Safety Authority (SSM),
Report number: 2018:09: 1 - 124
-
2017,
Airò M, Ala G, Buccheri P, Caruso M, Fascella G, Giovino A, Mammano MM
Beruto M, Ozudogru EA (eds.): VI International Symposium on Production and Establishment of Micropropagated Plants. Acta Horticulturae, volume 1155; ISHS; 387-392; ISBN 978-94-6261-151-1
-
German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE),
DIN EN 50527-2-1 VDE 0848-527-2-1:2017-12
-
German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE),
DIN EN 50527-1 VDE 0848-527-1:2017-12
-
ASTM,
ASTM F2213-17
-
2017,
Zhou J, Legenzoff Z, Yan X, Yang S, Xiang S, Shinde S, Lee J, Pommerenke D
2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), Tucson, AZ, USA. IEEE: 1-7; ISBN 978-1-5090-6499-1
-
2017 Nineteenth International Middle East Power Systems Conference (MEPCON), Cairo, Egypt. IEEE: 1276-1280; ISBN 978-1-5386-0991-0
-
2017,
Zhang X, Yarema KJ, Xu A
Springer Nature, Singapore Pte Ltd.; ISBN 978-981-10-3577-7