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2021,
Ragolia MA, Attivissimo F, Di Nisio A, Lanzolla AML, Scarpetta M
2021 IEEE International Symposium on Medical Measurements and Applications (MeMeA), Lausanne, Switzerland. IEEE: 1-6; ISBN 978-1-6654-3023-4
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2021,
Dyachkova ES, Mindubaev EA
2021 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus), St. Petersburg, Moscow, Russia. IEEE: 2795-2798; ISBN 978-1-6654-4642-6
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2021,
Green RB, Smith MV, Topsakal E
Topsakal E, Rahmat-Samii Y (eds.): Antenna and Sensor Technologies in Modern Medical Applications. IEEE, Hoboken, NJ, USA; 145-189; ISBN 978-1-119-68327-8
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2020,
Orel VE, Rykhalskyi O, Syvak L, Smolanka I, Smolanka Jr I, Loboda A, Lyashenko A, Dosenko I, Mokhonko A, Golovko T, Ganich A, Orel VB
2020 IEEE 40th International Conference on Electronics and Nanotechnology (ELNANO), Kyiv, Ukraine. IEEE: 474-477; ISBN 978-1-7281-9714-2
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2020,
Health Council of the Netherlands
The Hague: Health Council of the Netherlands,
publication no. 2020/16e: 1-33
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2019,
Cardoso V, Dinis H, Mendes PM
2019 IEEE 6th Portuguese Meeting on Bioengineering (ENBENG), Lisbon, Portugal. IEEE: 1-4; ISBN 978-1-5386-8507-5
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2019,
Jami AS, Guo X, Kulkarni P, Henin SE, Liu A, Chen Z
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: 6430-6433; ISBN 978-1-5386-1312-2
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2019,
Johansson JD, Alonso F, Wardell K
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: 5212-5216; ISBN 978-1-5386-1312-2
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2019,
Lee H, Lee JS, Chung Y, Jung WR, Seong Kang J, Seo DW, Shon YM, Na DL, Joon Kim S
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: 6141-6144; ISBN 978-1-5386-1312-2
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2018,
Sukvanicharat P, Panyasiripan N, Thaichinda S, Ratanaporncharoen K, Sittiprapaporn P
2018 International ECTI Northern Section Conference on Electrical, Electronics, Computer and Telecommunications Engineering (ECTI-NCON), Chiang Rai, Thailand. IEEE: 173-176; ISBN 978-1-5386-3553-7