The following terms were included:
synchronization, Synchronisation, 同期
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2023,
Sajda P, Sun X, Doose J, Faller J, McIntosh J, Saber G, Huffman S, Pantazatos S, Yuan H, Goldman R, Brown T, George M
Research Square,
rs.3.rs-3496521
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2023,
Zinno C, Agnesi F, Bernini F, Gabisonia K, Terlizzi D, Recchia FA, Lionetti V, Micera S
2023 45th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Sydney, Australia. IEEE: 1-4; ISBN 9798350324488
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2023,
Sun X, Doose J, Faller J, McIntosh JR, Saber GT, Huffman S, Pantazatos SP, Yuan H, Goldman RI, Brown TR, George MS, Sajda P
medRxiv: the Preprint Server for Health Sciences (medRxiv),
2023.10.09.23296751
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2023,
Li K, Mollel MS, Popoola O, Sambo Y, Imran MA
2023 5th International Conference on Computer Communication and the Internet (ICCCI), Fujisawa, Japan. IEEE: 185-189; ISBN 9798350326963
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2023,
Kuchina AP, Zakirova EA
2023 Systems of Signal Synchronization, Generating and Processing in Telecommunications (SYNCHROINFO), Pskov, Russian Federation. IEEE: 1-4; ISBN 9798350348323
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2022,
Wane S, Dinh TV, Tran QH, Bajon D, Ferrero F, Duvillaret L, Gaborit G, Sombrin J, de Lédinghen E, Laban P, Huard V, Mhira S, Tombakdjian L, Ratajczak P, Bousseksou A
2022 IEEE Radio and Wireless Symposium (RWS), Las Vegas, NV, USA. IEEE: 68-71; ISBN 978-1-6654-3463-8
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2022,
Sârbu A, Şorecău E, Şorecău M, Miclăuş S, Bechet P
2022 IEEE 9th Electronics System-Integration Technology Conference (ESTC), Sibiu, Romania. IEEE: 597-602; ISBN 978-1-6654-8948-5
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2022,
Chauhan M, Sadleir R
Sadleir R, Minhas AS (eds.): Electrical Properties of Tissues. Advances in Experimental Medicine and Biology, volume 1380; Springer, Cham; 111-134; ISBN 978-3-031-03872-3
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2022,
Betta G, Capriglione D, Cerro G, Miele G, Migliore MD, Šuka D
2022 IEEE International Symposium on Measurements & Networking (M&N), Padua, Italy. IEEE: 1-6; ISBN 978-1-6654-8363-6
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2021,
Yu Z, Chen JC, He Y, Alrashdan FT, Avants BW, Singer A, Robinson JT, Yang K
2021 IEEE Custom Integrated Circuits Conference (CICC), Austin, TX, USA. IEEE: 1-2; ISBN 978-1-7281-7582-9