The following terms were included:
t-Test, "Student's t-test", スチューデントt-検定, t-検定
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2022,
Sekiya K, Ishii N, Shimizu Y, Nagaoka T
2022 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM), Narashino, Japan. IEEE: 79-80; ISBN 978-1-6654-3239-9
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2022,
Chountala C, Chareau JM, Baldini G, Bonavitacola F
2022 9th International Conference on Wireless Networks and Mobile Communications (WINCOM), Rabat, Morocco. IEEE: 1-6; ISBN 978-1-6654-5277-9
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2022,
Gonzalez-Hernando F, Jauregi A, Villar I, Rujas A, Mir L
2022 IEEE Energy Conversion Congress and Exposition (ECCE), Detroit, MI, USA. IEEE: 1-7; ISBN 978-1-7281-9388-5
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2022,
Scialacqua L, Mioc F, Foged LJ, Anwar S, Luc J, Lelievre A, Mantash M, Gross N
2022 Antenna Measurement Techniques Association Symposium (AMTA), Denver, CO, USA. IEEE: 1-5; ISBN 978-1-6654-8427-5
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2022,
Xia M, Guo R, Zheng J, Chen J
2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), Spokane, WA, USA. IEEE: 610-613; ISBN 978-1-6654-0930-8
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2022,
Sá LA, Bortolazzo EMS, Costa Jr JA, de Oliveira PX
Bastos-Filho TF, de Oliveira Caldeira EM, Frizera-Neto A (eds.): XXVII Brazilian Congress on Biomedical Engineering, CBEB 2020. IFMBE Proceedings, volume 83; Springer, Cham; 25-30; ISBN 978-3-030-70600-5
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2022,
SSM’s Scientific Council on Electromagnetic Fields
Swedish Radiation Safety Authority (SSM),
Report number: 2022:16: 1-100
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2022,
Tikhomirov A, Kapravchuk V, Briko A, Malakhov A, Kobelev A, Hammoud A
2022 Ural-Siberian Conference on Biomedical Engineering, Radioelectronics and Information Technology (USBEREIT), Yekaterinburg, Russian Federation. IEEE: 82-85; ISBN 978-1-6654-6093-4
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2022,
Hammen L, Pichon L, Le Bihan Y, Bensetti M, Fleury G
2022 International Symposium on Electromagnetic Compatibility – EMC Europe, Gothenburg, Sweden. IEEE: 114-119; ISBN 978-1-6654-0789-2
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2022,
Li J, Changyuan W, Yujie Z
2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), Beijing, China. IEEE: 261-263; ISBN 978-1-6654-1672-6