The following terms were included:
t-Test, "Student's t-test", スチューデントt-検定, t-検定
-
2023 IEEE International Symposium on Product Compliance Engineering (ISPCE), Dallas, TX, USA. IEEE: 1-5; ISBN 978-1-6654-5679-1
-
2023,
Scialacqua L, Anwar S, Mioc F, Lelievre A, Mantash M, Luc J, Gross N, Foged LJ
2023 17th European Conference on Antennas and Propagation (EuCAP), Florence, Italy. IEEE: 1-5; ISBN 978-1-6654-7541-9
-
2023,
Rabhi R, Akbari-Chelaresi H, Gharsallah A, Ramahi OM
2023 17th European Conference on Antennas and Propagation (EuCAP), Florence, Italy. IEEE: 1-5; ISBN 978-1-6654-7541-9
-
2023,
Pérez M, Urbina R, Durán C, Martínez G, Gallego A, Fajardo A, Páez-Rueda CI, Araque JL
2023 17th European Conference on Antennas and Propagation (EuCAP), Florence, Italy. IEEE: 1-5; ISBN 978-1-6654-7541-9
-
International Electrotechnical Commission (IEC), Institute of Electrical and Electronics Engineers (IEEE),
IEEE/IEC P62209-3: 1-209
-
2023,
Hasan NI, Wang D, Gomez LJ
bioRxiv: the Preprint Server for Biology (bioRxiv),
2023.02.08.527758
-
2023,
Deng ZD, Robins PL, Dannhauer M, Haugen LM, Port JD, Croarkin PE
medRxiv: the Preprint Server for Health Sciences (medRxiv),
2023.02.06.23285526: 1-18
-
2023,
Jamshed MA, Héliot F, Brown TWC
Ur Rehman M, Jamshed MA (eds.): Low Electromagnetic Field Exposure Wireless Devices: Fundamentals and Recent Advances. Wiley-IEEE Press; 187-211; ISBN 978-1-119-90916-3
-
2022,
Wane S, Dinh TV, Tran QH, Bajon D, Ferrero F, Duvillaret L, Gaborit G, Sombrin J, de Lédinghen E, Laban P, Huard V, Mhira S, Tombakdjian L, Ratajczak P, Bousseksou A
2022 IEEE Radio and Wireless Symposium (RWS), Las Vegas, NV, USA. IEEE: 68-71; ISBN 978-1-6654-3463-8
-
2022,
Chehab MH, Khelil M, Salah CB
2022 IEEE 21st international Ccnference on Sciences and Techniques of Automatic Control and Computer Engineering (STA), Sousse, Tunisia. IEEE: 67-72; ISBN 978-1-6654-8262-2