The following terms were included:
t-Test, "Student's t-test", スチューデントt-検定, t-検定
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2022,
Xia M, Guo R, Zheng J, Chen J
2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), Spokane, WA, USA. IEEE: 610-613; ISBN 978-1-6654-0930-8
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2022,
Sá LA, Bortolazzo EMS, Costa Jr JA, de Oliveira PX
Bastos-Filho TF, de Oliveira Caldeira EM, Frizera-Neto A (eds.): XXVII Brazilian Congress on Biomedical Engineering, CBEB 2020. IFMBE Proceedings, volume 83; Springer, Cham; 25-30; ISBN 978-3-030-70600-5
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2022,
SSM’s Scientific Council on Electromagnetic Fields
Swedish Radiation Safety Authority (SSM),
Report number: 2022:16: 1-100
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2022,
Tikhomirov A, Kapravchuk V, Briko A, Malakhov A, Kobelev A, Hammoud A
2022 Ural-Siberian Conference on Biomedical Engineering, Radioelectronics and Information Technology (USBEREIT), Yekaterinburg, Russian Federation. IEEE: 82-85; ISBN 978-1-6654-6093-4
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2022,
Hammen L, Pichon L, Le Bihan Y, Bensetti M, Fleury G
2022 International Symposium on Electromagnetic Compatibility – EMC Europe, Gothenburg, Sweden. IEEE: 114-119; ISBN 978-1-6654-0789-2
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2022,
Li J, Changyuan W, Yujie Z
2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), Beijing, China. IEEE: 261-263; ISBN 978-1-6654-1672-6
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2022 International Conference on Electrical, Computer and Energy Technologies (ICECET), Prague, Czech Republic. IEEE: 1-4; ISBN 978-1-6654-7088-9
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2022,
Ali SM, Sovuthy C, Noghanian S, Abbasi QH, Asenova T, Derleth P, Casson A, Arslan T, Hussain A
2022 44th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Glasgow, Scotland, United Kingdom. IEEE: 4618-4621; ISBN 978-1-7281-2783-5
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2022,
Asok AO, Nath SJG, Tripathi A, Chauhan S, Kiran KS, Dey S
2022 IEEE Wireless Antenna and Microwave Symposium (WAMS), Rourkela, India. IEEE: 1-4; ISBN 978-1-6654-5847-4
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2022,
Capstick M, Mischa Sabathy, Brönnimann M, Rivara B, Bruno Klopott, Kühn S, Xi J, Choi D, Kuster N
2022 Wireless Power Week (WPW), Bordeaux, France. IEEE: 68-71; ISBN 978-1-6654-8446-6