The following terms were included:
threshold, Schwellenwert, "threshold value", 閾値
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2016,
van Rhoon GC, Paulides MM, van Holthe JM, Franckena M
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 359-362; ISBN 978-1-4577-0220-4
-
2016,
Macedo M, Wenger C, Salvador R, Fernandes SR, Miranda PC
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 5168-5171; ISBN 978-1-4577-0220-4
-
2016,
Panescu D, Kroll MW, Brave M
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 5241-5245; ISBN 978-1-4577-0220-4
-
2016,
Fernández-Rodríguez CE, Almeida de Salles AA
2016 IEEE MTT-S Latin America Microwave Conference (LAMC), Puerto Vallarta, Mexico. IEEE; ISBN 978-1-5090-4288-3
-
2016,
Karpowicz J, Gryz K, Zradzinski P
2016 International Conference on Applied and Theoretical Electricity (ICATE), Craiova, Romania. IEEE; ISBN 978-1-4673-8562-6
-
2016,
Lingdi F, Guizhi X, Hongli Y, Miaomiao G, Ning Y
2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), Shenzhen, China. IEEE: 1035-1037; ISBN 978-1-4673-9494-9
-
Federal Office for Radiation Protection (BfS),
Ressortforschungsberichte zur kerntechnischen Sicherheit und zum Strahlenschutz, BfS-RESFOR-104/15: 1-56
-
2015,
Panescu D, Kroll M, Andrews C, Pratt H
2015 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Milan, Italy. IEEE: 7208-7213; ISBN 978-1-4244-9271-8
-
2015,
Wenger C, Salvador R, Basser PJ, Miranda PC
2015 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Milan, Italy. IEEE: 2555-2558; ISBN 978-1-4244-9271-8
-
2015,
Kamimura Y, Sato Y, Yamashita A, Nagaoka T, Wake K
2015 IEEE International Symposium on Electromagnetic Compatibility (EMC), Dresden, Germany. IEEE: 1416-1419; ISBN 978-1-4799-6615-8