The following terms were included:
"cell viability", Zelllebensfähigkeit, 細胞生存力
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2018,
Daish C, Blanchard R, Duchi S, Onofrillo C, Augustine C, Fox K, Pivonka P, Pirogova E
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: pp. 4166-4169; ISBN 978-1-5386-3647-3
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2018,
Kaszuba-Zwoinska J, Nowak B, Guzdek P, Gil K
2018 EMF-Med 1st World Conference on Biomedical Applications of Electromagnetic Fields (EMF-Med), Split, Croatia. IEEE: pp. 1-2; ISBN 978-1-5386-5922-9
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2018,
Sun W, He Y, Diao Y, Leung SW, Siu YM, Kong YC
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: pp. 872-874; ISBN 978-1-5090-3955-5
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2017,
Mittal L, Raman V, Camarillo IG, Garner AL, Fairbanks AJ, Dunn GA, Sundararajan R
2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon (CEIDP), Fort Worth, TX, USA. IEEE: pp. 596-599; ISBN 978-1-5386-1195-1
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2017,
Koziorowska A, Romerowicz-Misielak M, Gierczak N, Gniady S, Koziorowski M
IEEE EUROCON 2017 -17th International Conference on Smart Technologies, Ohrid, Macedonia. IEEE: pp. 537-541; ISBN 978-1-5090-3844-2
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2017,
Schmidt S, Schüßler M, Luo Z, Jakoby R, Herce HD, Cardoso MC
2017 First IEEE MTT-S International Microwave Bio Conference (IMBIOC), Gothenburg, Sweden. IEEE; ISBN 978-1-5386-1714-4
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2016 8th International Conference on Ultrawideband and Ultrashort Impulse Signals (UWBUSIS), Odessa, Ukraine. IEEE: pp. 54-57; ISBN 978-1-5090-1580-1
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2016,
Liu H, Yao C, Mi Y, Li C, Zhao Y, Lv Y
2016 IEEE International Power Modulator and High Voltage Conference (IPMHVC), San Francisco, CA, USA. IEEE; ISBN 978-1-5090-2355-4
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2016,
Restrepo AF, Tobar VE, Camargo RJ, Franco E, Pinedo CR, Gutierrez O
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: pp. 4193-4196; ISBN 978-1-4577-0220-4
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2016,
Casciola M, Liberti M, Apollonio F, Denzi A
2016 12th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME), Lisbon, Portugal. IEEE: pp. 1-4; ISBN 978-1-5090-0494-2