The following terms were included:
変電所, Umspannwerk, "electrical substation"
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2019,
Liu B, Ouyang Z, Li P, Qu Y, Wu T, Wei Z
2019 22nd International Conference on Electrical Machines and Systems (ICEMS), Harbin, China. IEEE: 1-5; ISBN 978-1-7281-3399-7
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2019,
Rathebe PC, Modisane DS, Rampedi MB, Biddesay-Manila S, Mbonane TP
2019 Open Innovations (OI), Cape Town, South Africa. IEEE: 219-221; ISBN 978-1-7281-3465-9
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2019,
Laakso I, Lehtinen T
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan. IEEE: 334-337; ISBN 978-1-7281-1639-6
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2019,
Chen H, Gao Y, Zhu X
2019 IEEE Innovative Smart Grid Technologies - Asia (ISGT Asia), Chengdu, China. IEEE: 24-26; ISBN 978-1-7281-3521-2
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2019,
Frigura-Iliasa M, Baloi FI, Olariu AF, Petrenci RC
2019 20th International Scientific Conference on Electric Power Engineering (EPE), Kouty nad Desnou, Czech Republic. IEEE: 1-4; ISBN 978-1-7281-1335-7
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2019,
Frigura-Iliasa M, Baloi FI, Olariu AF, Petrenci RC
2019 International Conference on Information and Digital Technologies (IDT), Zilina, Slovakia. IEEE: 149-152; ISBN 978-1-7281-1402-6
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2019,
Rathebe PC, Mbonane TP
2018 IEEE 4th Global Electromagnetic Compatibility Conference (GEMCCON), Stellenbosch, South Africa. IEEE: 1-3; ISBN 978-1-5386-5729-4
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2019,
Ndirangu J, Kimemia P, Nderu J, Ndolo R, Irungu G
2019 International Conference on High Voltage Engineering and Technology (ICHVET), Hyderabad, India. IEEE: 1-6; ISBN 978-1-5386-7577-9
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2018,
Silva AAR, Silva LB, Silva RM, Dias RBB
Arezes PM, Baptista JS, Barroso MP, Carneiro P, Cordeiro P, Costa N, Melo RB, Miguel AS, Perestrelo G (eds.): Occupational Safety and Hygiene VI: Book Chapters from the 6th International Symposium on Occupation Safety and Hygiene (SHO 2018), March 26-27, 2018, Guimarães, Portugal. CRC Press/Balkema, Leiden, The Netherlands; 213-217; ISBN 978-1-138-54203-7
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Balas VE, Jain LC, Balas MM (eds.): Soft Computing Applications. SOFA 2016. Advances in Intelligent Systems and Computing, volume 633; Springer, Cham; 95-106; ISBN 978-3-319-62520-1