-
2023,
Gogulski J, Cline CC, Ross JM, Parmigiani S, Keller CJ
bioRxiv: the Preprint Server for Biology (bioRxiv),
2023.09.04.556283
-
2023,
Becker CR, Milad MR
Milad MR, Norrholm SD (eds.): Fear Extinction. Current Topics in Behavioral Neurosciences, volume 64; Springer, Springer, Cham; 353–387; ISBN 978-3-031-43004-6
-
2023,
Frey J, Ramirez-Zamora A, Wagle Shukla A
Shaikh A, Sadnicka A (eds.): Basic and Translational Applications of the Network Theory for Dystonia. Advances in Neurobiology, volume 31; Springer, Cham; 119-139; ISBN 978-3-031-26219-7
-
2019,
Khan A, Haueisen J, Wolters CH, Antonakakis M, Vogenauer N, Wollbrink A, Suntrup-Krueger S, Schneider TR, Herrmann CS, Nitsche M, Paulus W
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: 5894-5897; ISBN 978-1-5386-1312-2
-
2017,
Koziorowska A, Romerowicz-Misielak M, Gierczak N, Gniady S, Koziorowski M
IEEE EUROCON 2017 -17th International Conference on Smart Technologies, Ohrid, Macedonia. IEEE: 537-541; ISBN 978-1-5090-3844-2
-
2017,
Panescu D, Kroll MW, Brave MA
2017 39th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Jeju, Korea (South). IEEE: 2191-2196; ISBN 978-1-5090-2810-8
-
2014,
Suzuki Y, Koike A, Takamura M, Taki M, Kojima M, Sasaki K, Chakarothai J, Wake K, Watanabe S
2014 International Symposium on Electromagnetic Compatibility, Gothenburg, Sweden. IEEE: 832-835; ISBN 978-4-88552-287-1
-
2014,
Suzuki Y, Sasaki M, Chakarothai J, Kojima M, Sasaki K, Takamura M, Wake K, Taki M
2014 XXXIth URSI General Assembly and Scientific Symposium (URSI GASS), Beijing, China. IEEE: 14693724; ISBN 978-1-4673-5225-3
-
2013,
Langguth B, de Ridder D
Lozano AM, Hallett M (eds.): Brain Stimulation. Handbook of Clinical Neurology, volume 116; Elsevier, Amsterdam; 441-467; ISBN 978-0-444-53497-2
-
2011,
Walcott GP, Kroll MW, Ideker RE
2011 Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Boston, MA, USA. IEEE: 255-258; ISBN 978-1-4577-1589-1