The following terms were included:
t-Test, "Student's t-test", スチューデントt-検定, t-検定
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2023,
Sarkar S, Kaysir MR, Islam MJ
2023 26th International Conference on Computer and Information Technology (ICCIT), Cox's Bazar, Bangladesh. IEEE: 1-6; ISBN 9798350359022
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2023,
Mustafa BT, Yaba SP, Ismail AH
2023 9th International Engineering Conference on Sustainable Technology and Development (IEC), Erbil, Iraq. IEEE: 32-37; ISBN 9798350335071
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2023 7th International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech), Kolkata, India. IEEE: 1-6; ISBN 9798350328943
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2023,
Peng C, Dan L, Jia-Hui Z
2023 IEEE 11th International Conference on Information, Communication and Networks (ICICN), Xi'an, China. IEEE: 524-527; ISBN 9798350314021
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2023,
Senwen L, Zhizhong W, Yan R, Huagang W, Shaochuan C
2023 IEEE 11th International Conference on Information, Communication and Networks (ICICN), Xi'an, China. IEEE: 432-440; ISBN 9798350314021
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2023,
Gutiérrez-Martínez J, Toledo-Peral CL, Vega-Martínez G, Mercado-Gutiérrez JA
2023 Global Medical Engineering Physics Exchanges/Pacific Health Care Engineering (GMEPE/PAHCE), Songdo, Korea, Republic of. IEEE: 1-6; ISBN 9798350304015
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2023,
Vélez RS, van Helvoort MJAM, Vogt-Ardatjew R, Van den Berg B, Leferink F
2023 International Symposium on Electromagnetic Compatibility – EMC Europe, Krakow, Poland. IEEE: 1-6; ISBN 9798350324013
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2023,
Zhou X, Dou L, Huang H, Shen Q, Zhou X, Li A, Tang W, Pang X, Zhang Y, Wu T
2023 IEEE 7th International Symposium on Electromagnetic Compatibility (ISEMC), Hangzhou, China. IEEE: 1-5; ISBN 9798350333114
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2023,
Xinhua P, Xin Z, Huixiong H, Qingfei S, Anxiang L, Wei T, Chao Y, Tong W
2023 IEEE 7th International Symposium on Electromagnetic Compatibility (ISEMC), Hangzhou, China. IEEE: 1-5; ISBN 9798350333114
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2023 IEEE 7th International Symposium on Electromagnetic Compatibility (ISEMC), Hangzhou, China. IEEE: 1-4; ISBN 9798350333114