To study whether extremely low frequency magnetic field exposure produce alterations in the growth, cell cycle, survival and DNA damage of wild type and mutant yeast strains.
Double strand breaks are repaired in Saccharomyces cerevisiae in different DNA repair pathways: 1) Homologous recombination, 2) single-strand annealing, and 3) nonhomologous end joining. Rad52 mutant yeast cells cannot repair double-strand breaks via homologous recombination and show reduced ability for single-strand annealing. In HDF1 mutant cells the nonhomologous end joining pathway is affected. In rad52 hdf1 double mutants, all pathways of double-strand breaks DNA repair are blocked.
| Exposure | Parameters |
|---|---|
|
Exposure 1:
50 Hz
Exposure duration:
continuous for 96 h
|
|
| Frequency | 50 Hz |
|---|---|
| Type | |
| Waveform | |
| Exposure duration | continuous for 96 h |
| Measurand | Value | Type | Method | Mass | Remarks |
|---|---|---|---|---|---|
| magnetic flux density | 2.45 mT | - | measured | - | - |
The authors conclude that the extremely low frequency magnetic field exposure (2.45 mT sinusoidal 50 Hz, 96 h) induced alterations in the growth (increase in rad52 mutant) and survival (a statistically not sigificant decrease) of Saccharomyces cerevisiae strains deficient in DNA strand breaks repair. However, the magnetic field exposure did not induce alterations in the cell cycle and did not cause DNA damage.
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