Die folgenden Begriffe wurden einbezogen:
Plasma, Blutplasma, "blood plasma", 血漿
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2019,
De Angelis A, Denzi A, Merla C, Andre FM, Garcia-Sanchez T, Mir LM, Apollonio F, Liberti M
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: S. 134-137; ISBN 978-1-5386-1312-2
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2019,
Skotnicki T, Knap W
2019 MIXDES - 26th International Conference "Mixed Design of Integrated Circuits and Systems", Rzeszow, Poland. IEEE: S. 34-37; ISBN 978-1-7281-3408-6
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2018 8th International Conference on Intelligent Systems, Modelling and Simulation (ISMS), Kuala Lumpur, Malaysia. IEEE: S. 62-66; ISBN 978-1-5386-6540-4
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2018,
Denzi A, Merla C, Andre FM, Garcia-Sanchez T, Mir LM, Apollonio F, Liberti M
2018 IEEE International Microwave Biomedical Conference (IMBioC), Philadelphia, PA, USA. IEEE: S. 19-21; ISBN 978-1-5386-5919-9
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2018,
Dong F, Liu Z, Zhang J, Fang J, Guo J, Zhang J, Fang J, Zhang Y
2017 IEEE International Conference on Plasma Science (ICOPS), Atlantic City, NJ, USA. IEEE: S. 1; ISBN 978-1-5090-5244-8
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2018,
Dürrenberger G, Fröhlich J, Meya K, Schmid M
Bundesamt für Strahlenschutz (BfS),
Ressortforschungsberichte zur kerntechnischen Sicherheit und zum Strahlenschutz, BfS-RESFOR-142/18: 1-170
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2017,
Mazurek PA, Pawlat J, Kwiatkowski M, Terebun P
2017 International Conference on Electromagnetic Devices and Processes in Environment Protection with Seminar Applications of Superconductors (ELMECO & AoS), Naleczow, Poland. IEEE: S. 1-4; ISBN 978-1-5386-1944-5
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2017,
Jain S, Baratchi S, Pirogova E
2017 Progress in Electromagnetics Research Symposium - Fall (PIERS - FALL), Singapore. IEEE, Singapore, Singapore: S. 1268-1272; ISBN 978-1-5386-1211-8
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2017,
Bo W, Xu J, Tang J, Yang Y, Ma J, Wang Z, Gong Y
2017 42nd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Cancun, Mexico. IEEE, Cancun, Mexico; ISBN 978-1-5090-6050-4
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2017,
Katsuki S, Li Y, Miyakawa D, Yamada R, Onishi N, Lim S
2017 11th European Conference on Antennas and Propagation (EUCAP), Paris. IEEE, Paris, France; ISBN 978-88-907018-7-0