Die folgenden Begriffe wurden einbezogen:
"Elektrisches Feld", EF, "electric field", 電界
-
2023,
Jeladze V, Thielens A, Nozadze T, Korkotadze G, Partsvania B, Zaridze R
2023 IEEE XXVIII International Seminar/Workshop on Direct and Inverse Problems of Electromagnetic and Acoustic Wave Theory (DIPED), Tbilisi, Georgia. IEEE: 180-185; ISBN 9798350315349
-
2023,
Wang S, Ben Chikha W, Zhang Y, Liu J, Conil E, Jawad O, Ourak L, Wiart J
2023 XXXVth General Assembly and Scientific Symposium of the International Union of Radio Science (URSI GASS), Sapporo, Japan. IEEE: 1-4; ISBN 9798350309973
-
2023,
Caramazza L, Marracino P, Liberti M, Apollonio F
2023 XXXVth General Assembly and Scientific Symposium of the International Union of Radio Science (URSI GASS), Sapporo, Japan. IEEE: 1-4; ISBN 9798350309973
-
2023,
Fracassi D, D’Annibale V, D’Abramo M, D’Inzeo G
2023 XXXVth General Assembly and Scientific Symposium of the International Union of Radio Science (URSI GASS), Sapporo, Japan. IEEE: 1-4; ISBN 9798350309973
-
2023,
Kangasmaa O, Kataja J, Laakso I
2023 XXXVth General Assembly and Scientific Symposium of the International Union of Radio Science (URSI GASS), Sapporo, Japan. IEEE: 1-4; ISBN 9798350309973
-
2023,
Liu S, Tsuchiya N, Onishi T, Taki M, Watanabe S, Suzuki Y
2023 XXXVth General Assembly and Scientific Symposium of the International Union of Radio Science (URSI GASS), Sapporo, Japan. IEEE: 1-3; ISBN 9798350309973
-
2023,
Shiina T, Sekiba Y, Yamazaki K
2023 XXXVth General Assembly and Scientific Symposium of the International Union of Radio Science (URSI GASS), Sapporo, Japan. IEEE: 1-4; ISBN 9798350309973
-
2023 XXXVth General Assembly and Scientific Symposium of the International Union of Radio Science (URSI GASS), Sapporo, Japan. IEEE: 1-2; ISBN 9798350309973
-
2023,
Aberra AS, Wang R, Grill WM, Peterchev AV
bioRxiv: the Preprint Server for Biology (bioRxiv),
2023.08.23.554447
-
2023,
Szabó D, Gyergyádesz L, Németh B, Ramirez-Bettoni E
2023 IEEE Power & Energy Society General Meeting (PESGM), Orlando, FL, USA. IEEE: 1-5; ISBN 978-1-6654-6442-0