Die folgenden Begriffe wurden einbezogen:
"Elektromagnetisches Feld", EMF, "electromagnetic field", 電磁界
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Spotlight, Mai/2024 no.4: 1-5
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Institute of Electrical and Electronics Engineers (IEEE),
P2725.1/D4, Aug 2024: 1-65, ISBN 9798855712186
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Institute of Electrical and Electronics Engineers (IEEE),
P2725.1/D3, Jun 2024: 1-65, ISBN 9798855709759
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2024,
Keine Autoren angegeben
J Cell Physiol 239 (6): Artikel-ID e31240
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2024,
Poljak D, Šušnjara A
IEEE Press Series on Electromagnetic Wave Theory; Wiley-IEEE Press; ISBN 978-1-119-98924-0
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Deutsche Kommission Elektrotechnik Elektronik Informationstechnik in DIN und VDE (DKE),
E DIN EN IEC 62764-1 VDE 0848-764-1:2023-08
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Strahlenschutzkommission (SSK),
1-13
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Maqbool M (Hrsg.): Bentham Science Publisher, Singapore; ISBN 978-981-5136-90-6
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Scientific Committee on Health, Environmental and Emerging Risks (SCHEER),
1-35
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Scientific Committee on Health, Environmental and Emerging Risks (SCHEER),
1-56
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2023,
Keine Autoren angegeben
2023 IEEE Wireless Power Technology Conference and Expo (WPTCE), San Diego, CA, USA. IEEE: S. 1-6; ISBN 9798350337389
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2023,
Keine Autoren angegeben
BGBl I (149): 1-12
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bioRxiv: the Preprint Server for Biology (bioRxiv),
2023.01.13.523921
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Deutscher Bundestag,
Drucksache 20/5646: 1-312
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Institute of Electrical and Electronics Engineers (IEEE),
IEEE Std C95.7-2022: 1-139, ISBN 978-1-5044-9390-1
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International Electrotechnical Commission (IEC), Institute of Electrical and Electronics Engineers (IEEE),
P62209-3/ED2, Feb 2023: 1-209, ISBN 978-1-5044-9471-7
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French Agency for Food, Environmental and Occupational Health & Safety (ANSES),
Saisine n° 2019-SA-0006: 1-294
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French Agency for Food, Environmental and Occupational Health & Safety (ANSES),
ANSES Opinion, Request No 2019-SA-0006: 1-25
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Panagopoulos DJ (Hrsg.): CRC Press, Boca Raton; ISBN 978-1-032-06175-7
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Weltgesundheitsorganisation (WHO),
1-3
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Springer, Cham; ISBN 978-3-030-98773-2
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GSM Association (GSMA),
1-28
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Bund/Länder-Arbeitsgemeinschaft für Immissionsschutz (LAI),
1-49
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Scientific Committee on Health, Environmental and Emerging Risks (SCHEER),
1-48
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Institute of Electrical and Electronics Engineers (IEEE),
IEEE Std 1584.1-2022: 1-30, ISBN 978-1-5044-8723-8