Die folgenden Begriffe wurden einbezogen:
"cell proliferation", Zellproliferation, Proliferation, 細胞増殖, 増殖
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2023,
Ravin R, Cai TX, Li A, Briceno N, Pursley RH, Garmendia-Cedillos M, Pohida T, Wang H, Zhuang Z, Cui J, Morgan NY, Williamson NH, Gilbert MR, Basser PJ
bioRxiv: the Preprint Server for Biology (bioRxiv),
2023.01.18.524504
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2023,
Jamshed MA, Héliot F, Brown TWC, Ur Rehman M
Ur Rehman M, Jamshed MA (Hrsg.): Low Electromagnetic Field Exposure Wireless Devices: Fundamentals and Recent Advances. Wiley-IEEE Press; 1-18; ISBN 978-1-119-90916-3
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2022,
Novotny DR, Christensen N, Kothari S, Langiewicz L
2022 IEEE International Symposium on Product Compliance Engineering (ISPCE), San Diego, CA, USA. IEEE: 1-6; ISBN 978-1-6654-9789-3
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2022,
Bajtos M, Radil R, Janoušek L, Hargasova K, Student S, Kocikowska O
2022 23rd International Conference on Computational Problems of Electrical Engineering (CPEE), Zuberec, Slovakia. IEEE: 1-4; ISBN 9798350396263
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2022,
Carnecka L, Bajtos M, Judakova Z, Radil R, Janousek L
2022 ELEKTRO (ELEKTRO), Krakow, Poland. IEEE: 1-5; ISBN 978-1-6654-6727-8
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2022,
Dasi S, Srinivas Y, Vadivel M, Satpathy R, Dash BB, De UC
2022 International Conference on Electronics and Renewable Systems (ICEARS), Tuticorin, India. IEEE: 506-510; ISBN 978-1-6654-8426-8
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2021,
Concepcion R, Izzo LG, Cuello J, Sybingco E, Dadios E
2021 IEEE 13th International Conference on Humanoid, Nanotechnology, Information Technology, Communication and Control, Environment, and Management (HNICEM), Manila, Philippines. IEEE: 1-6; ISBN 978-1-6654-0168-5
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2021,
Meneses J, Fernandes SR, Alves N, Pascoal-Faria P, Miranda PC
2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Mexico. IEEE: 4147-4151; ISBN 978-1-7281-1179-7
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2021,
Sacco G, Nikolavev D, Sauleau R, Zhadobov M
2021 XXXIVth General Assembly and Scientific Symposium of the International Union of Radio Science (URSI GASS), Rome, Italy. IEEE: 1-4; ISBN 978-1-6654-2995-5
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2021,
Radil R, Barabas J, Janoušek L, Kamencay P
2021 13th International Conference on Measurement, Bratislava, Slovakia. IEEE: 186-189; ISBN 978-1-6654-3245-0