Die folgenden Begriffe wurden einbezogen:
"electromagnetic compatibility", "elektromagnetische Verträglichkeit", EMC, EMV, 電磁両立性
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16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: S. 1-4; ISBN 978-1-5090-3198-6
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2005,
Bitz A, El Ouardi A, Streckert J, Hansen V
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: S. 115-118; ISBN 978-1-5090-3198-6
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2005,
Meyer FJC, van Wyk MJ, Kellerman RA
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: S. 111-114; ISBN 978-1-5090-3198-6
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16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: S. 123-126; ISBN 978-1-5090-3198-6
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2005,
Nyenhuis JA, Amjad A, Kamondetdacha R, Park SM
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: S. 13-16; ISBN 978-1-5090-3198-6
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2005,
Francavilla M, Schiavoni A
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: S. 107-110; ISBN 978-1-5090-3198-6
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2005,
Merla C, Liberti M, Orlando AR, Apollonio F, D'Inzeo G
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: S. 89-92; ISBN 978-1-5090-3198-6
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2005,
Wu D, Qiang R, Chen J, Kainz W, Seidman S
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005, Chicago, IL, USA. Band 3; IEEE: S. 796-800; ISBN 978-0-7803-9380-6
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IEEE 6th International Symposium on Electromagnetic Compatibility and Electromagnetic Ecology, 2005, St. Petersburg, Russia. IEEE: S. 9-14; ISBN 978-0-7803-9374-5
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2005,
Shizeng W, Zhaojin C, Changzhe W, Jing Y
2005 IEEE International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, Beijing, China. Band 1; IEEE: S. 605-609; ISBN 978-0-7803-9128-4