Die folgenden Begriffe wurden einbezogen:
"electromagnetic radiation", "Elektromagnetische Strahlung", "elektromagnetische Wellen", "electromagnetic waves", EMR, 電磁放射線, 電磁放射
-
2017,
Zvezdina MY, Shokova YA, Krivtsova MG, Golovko TM, Cherskaya AA
2017 Radiation and Scattering of Electromagnetic Waves (RSEMW), Divnomorskoe, Russia. IEEE: S. 73-76; ISBN 978-1-5386-2783-9
-
2017,
Etem T, Pala Z, Bozkurt I
2017 XIIIth International Conference on Perspective Technologies and Methods in MEMS Design (MEMSTECH), Lviv, Ukraine. IEEE: S. 129-131; ISBN 978-1-5386-4002-9
-
2017,
Meenu L, Aiswarya S, Menon SK
2017 IEEE International Conference on Smart Technologies and Management for Computing, Communication, Controls, Energy and Materials (ICSTM), Chennai, India. IEEE: S. 299-303; ISBN 978-1-5090-5906-5
-
2017,
Kisel NN, Cheremisov VA, Kisel DV
2017 Progress In Electromagnetics Research Symposium - Spring (PIERS), St. Petersburg, Russia. IEEE: S. 3433-3438; ISBN 978-1-5090-6270-6
-
2017,
Jovicic K, Koprivica M, Kuzle I, Neskovic N, Neskovic A
[2017 25th Telecommunication Forum (TELFOR)], Belgrade, Serbia. IEEE: S. 1-2; ISBN 978-1-5386-3074-7
-
2017,
Gil I, Fernández-García R
2017 Progress In Electromagnetics Research Symposium - Spring (PIERS), St. Petersburg, Russia. IEEE: S. 655-659; ISBN 978-1-5090-6270-6
-
2017,
Smolyanskaya OA, Odlyanitskiy EL, Chivilikchin SA, Schelkanova IJ, Kozlov SA
2017 42nd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Cancun, Mexico. IEEE: S. 1-2; ISBN 978-1-5090-6050-4
-
2017,
Salih ZH, Hasan GT, Mohammed MA
2017 9th International Conference on Electronics, Computers and Artificial Intelligence (ECAI), Targoviste, Romania. IEEE: S. 1-4; ISBN 978-1-5090-6459-5
-
2017,
Yener SC, Cerezci O, Cerezci F
[2017 Electric Electronics, Computer Science, Biomedical Engineerings' Meeting (EBBT)], Istanbul, Turkey. IEEE: S. 1-4; ISBN 978-1-5386-0441-0
-
2017,
Li H, Ma X, Du X, Ning Y, Cheng X, Hwang JCM
2017 IEEE MTT-S International Microwave Symposium (IMS), Honololu, HI, USA. IEEE: S. 869-871; ISBN 978-1-5090-6361-1