Die folgenden Begriffe wurden einbezogen:
"specific absorption rate", "Spezifische Absorptionsrate", SAR, "specific energy absorption rate", 比エネルギー吸収率, 比吸収率
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2020,
Cao Z, Yan X, Gore JC, Grissom WA
Magn Reson Med 83 (6): 2331-2342
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2020,
Hediya AM, Attiya AM, El-Deeb WS
2020 8th International Japan-Africa Conference on Electronics, Communications, and Computations (JAC-ECC), Alexandria, Egypt. IEEE: S. 24-28; ISBN 978-1-6654-0437-2
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2020,
Cordero-Samortin A, Dela Cruz JC, Garcia R, Mabunga Z
2020 IEEE 12th International Conference on Humanoid, Nanotechnology, Information Technology, Communication and Control, Environment, and Management (HNICEM), Manila, Philippines. IEEE: S. 1-6; ISBN 978-1-6654-2997-9
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2020,
Kolosnjaj-Tabi J, Alberola G, Augé S, Tamra A, Dubuc D, Grenier K, Rols MP
2020 IEEE MTT-S International Microwave Biomedical Conference (IMBioC), Toulouse, France. IEEE: S. 1-3; ISBN 978-1-7281-5867-9
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2020,
Basu S, Mitra D, Mandal B, Augustine R
2020 IEEE MTT-S International Microwave Biomedical Conference (IMBioC), Toulouse, France. IEEE: S. 1-4; ISBN 978-1-7281-5867-9
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2020,
Winkler SA, Saniour I, Chaudhari A, Robb F, Vaughan JT
2020 IEEE MTT-S International Microwave Biomedical Conference (IMBioC), Toulouse, France. IEEE: S. 1-3; ISBN 978-1-7281-5867-9
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2020,
Kaburcuk F, Elsherbeni AZ, Lumnitzer R, Tanner A
2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting, Montreal, QC, Canada. IEEE: S. 1309-1310; ISBN 978-1-7281-6671-1
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2020,
Mishra PK, Raj S, Tripathi VS
2020 IEEE 7th Uttar Pradesh Section International Conference on Electrical, Electronics and Computer Engineering (UPCON), Prayagraj, India. IEEE: S. 1-5; ISBN 978-1-6654-4747-8
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2020,
Vilagosh Z, Lajevardipour A, Wood A
2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Buffalo, NY, USA. IEEE: S. 1; ISBN 978-1-7281-6621-6
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2020,
Devi Sharma M, Yadav A, Singhal S, Sharma R
2020 5th IEEE International Conference on Recent Advances and Innovations in Engineering (ICRAIE), Jaipur, India. IEEE: S. 1-6; ISBN 978-1-7281-8868-3