Die folgenden Begriffe wurden einbezogen:
インキュベータ, Inkubator, incubator
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2022,
Judáková Z, Janoušek L, Čarnecká L, Švantnerová I
2022 23rd International Conference on Computational Problems of Electrical Engineering (CPEE), Zuberec, Slovakia. IEEE: S. 1-4; ISBN 9798350396263
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2021,
Ardiatna W, Nugroho HW, Hidayat SW, Sukma I, Supono I, Mandaris D
2021 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), Nusa Dua - Bali, Indonesia. IEEE: S. 1-4; ISBN 978-1-7281-7622-2
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2021,
Judáková Z, Janoušek L, Čarnecká L, Oreničová D
2021 22nd International Conference on Computational Problems of Electrical Engineering (CPEE), Hrádek u Sušice, Czech Republic. IEEE: S. 1-4; ISBN 978-1-7281-8431-9
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2021,
Watanalaorsomboon S, Punpai S, Tanechpongtamb W, Tarateeraseth V
2021 18th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON), Chiang Mai, Thailand. IEEE: S. 654-657; ISBN 978-1-6654-4738-6
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2020,
Kataoka M, Shinohara N, Miyakoshi J
2020 IEEE Wireless Power Transfer Conference (WPTC), Seoul, Korea (South). IEEE: S. 424-427; ISBN 978-1-7281-4239-5
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2020,
Judakova Z, Janousek L
2020 IEEE 21st International Conference on Computational Problems of Electrical Engineering (CPEE), Online-Konferenz. IEEE: S. 1-4; ISBN 978-1-7281-9618-3
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2020,
Songsiri S, Tarateeraseth V, Tanechpongtamb W
2020 17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON), Phuket, Thailand. IEEE: S. 283-286; ISBN 978-1-7281-6487-8
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2019,
Barabas J, Radil R, Janousek L
2019 IEEE 20th International Conference on Computational Problems of Electrical Engineering (CPEE), Lviv-Slavske, Ukraine. IEEE: S. 1-4; ISBN 978-1-7281-2811-5
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2017,
Ostafin M, Miernik A, Drozdz T, Nawara P, Gliniak M, Kielbasa P, Tabor S
2017 Progress in Applied Electrical Engineering (PAEE), Koscielisko, Poland. IEEE: S. 1-5; ISBN 978-1-5386-1529-4
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2017,
Sun W, He Y, Diao Y, Leung SW, Siu YM, Kong R
2017 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), Seoul, Korea (South). IEEE; ISBN 978-1-5386-3913-9