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2019,
Thomas C, Ghodratitoostani I, Delbem ACB, Ali A, Datta A
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: 5196-5199; ISBN 978-1-5386-1312-2
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2019,
Sekiba Y, Yamazaki K
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan. IEEE: 83-86; ISBN 978-1-7281-1639-6
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2019,
Makarov S, Horner M, Noetscher G
Springer International Publishing, Cham (Schweiz); ISBN 978-3-030-21292-6
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2019,
Ahmed S, Sydänheimo L, Ukkonen L, Björninen T
2019 International Conference on Electromagnetics in Advanced Applications (ICEAA), Granada, Spain. IEEE: 55-59; ISBN 978-1-7281-0564-2
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2019,
Koohestani M, Zhadobov M, Ettorre M
2016 IEEE International Symposium on Antennas and Propagation (APSURSI), Fajardo, PR, USA. IEEE: 161-162; ISBN 978-1-5090-2887-0
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2019,
Zucca M, Bottauscio O, Harmon S, Guilizzoni R, Schilling F, Schmidt M, Ankarson P, Bergsten T, Tammi K, Sainio P, Romero JB, Puyal EL, Pichon L, Freschi F, Cirimele V, Bauer P, Dong J, Maffucci A, Ventre S, Femia N, Di Capua G, Kuster N, Liorni I
2019 AEIT International Conference of Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE), Torino, Italy. IEEE: 1-6; ISBN 978-1-7281-3278-5
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2019,
Ilie-Săndoiu AM, Morega M, Morega AM
2019 11th International Symposium on Advanced Topics in Electrical Engineering (ATEE), Bucharest, Romania. IEEE: 1-4; ISBN 978-1-7281-0102-6
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2018,
Zeng Q, Liu J, Zheng J, Lloyd T, Angelone LM, Kainz W, Chen J
2018 International Applied Computational Electromagnetics Society Symposium (ACES), Denver, CO, USA. IEEE: 1-2; ISBN 978-1-5386-4857-5
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2018,
Smondrk M, Benova M, Psenakova Z
19th International Conference Computational Problems of Electrical Engineering, Banska Stiavnica, Slovakia. IEEE: 1-4; ISBN 978-1-5386-7896-1
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2018,
Manoufali M, Abbosh A
2018 IEEE International Symposium on Antennas and Propagation & USNC/URSI National Radio Science Meeting, Boston, MA, USA. IEEE: 215-216; ISBN 978-1-5386-7103-0