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2005,
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2005,
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2005,
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2005,
Meyer FJC, van Wyk MJ, Kellerman RA
16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: S. 111-114; ISBN 978-1-5090-3198-6
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16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: S. 123-126; ISBN 978-1-5090-3198-6
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2005,
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16th International Zurich Symposium and Technical Exposition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: S. 107-110; ISBN 978-1-5090-3198-6
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2005,
Adang D, Remacle C, Vander Vorst A
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2005,
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