Die folgenden Begriffe wurden einbezogen:
Bestrahlung, Befeldung, irradiation, 照射
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2020,
Kundu A, Gupta B, Patra K, Mallick AI
2020 IEEE Calcutta Conference (CALCON), Kolkata, India. IEEE: 132-136; ISBN 978-1-7281-5362-9
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2019,
Zhang Y, Guo X, Li T, Zhang M, Feng Y, Li W, Zhu X, Gu R, Zhou L
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: 1318-1320; ISBN 978-1-5386-1312-2
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2019,
Radil R, Barabas J, Kamencay P, Bajtos M, Hargasova K
2019 12th International Conference on Measurement, Smolenice, Slovakia. IEEE: 119-122; ISBN 978-1-7281-2743-9
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2019,
Sakakibara K, Hikage T, Kageyama I, Masuda H
2019 IEEE Conference on Antenna Measurements & Applications (CAMA), Kuta, Bali, Indonesia. IEEE: 195-198; ISBN 978-1-7281-2397-4
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2019,
Barabas J, Radil R, Janousek L
2019 IEEE 20th International Conference on Computational Problems of Electrical Engineering (CPEE), Lviv-Slavske, Ukraine. IEEE: 1-4; ISBN 978-1-7281-2811-5
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2019,
Kageyama I, Masuda H, Morimatsu Y, Ishitake T, Sakakibara K, Hikage T, Hirata A
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan. IEEE: 766-769; ISBN 978-1-7281-1639-6
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2019,
Andrenko AS, Shimizu Y, Wake K
2019 IEEE International Conference on RFID Technology and Applications (RFID-TA), Pisa, Italy. IEEE: 297-300; ISBN 978-1-7281-0590-1
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2019,
Vrba D, Vrba J, Rodrigues DB, Stauffer P
2019 European Microwave Conference in Central Europe (EuMCE), Prague, Czech Republic. IEEE: 440-443; ISBN 978-1-7281-1240-4
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2019,
Nefzi A, Carr L, Arnaud-Cormos D, Leveque P
2019 European Microwave Conference in Central Europe (EuMCE), Prague, Czech Republic. IEEE: 631-634; ISBN 978-1-7281-1240-4
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2019,
Danker-Hopfe H, Dorn H, Eggert T, Sauter C
Bundesamt für Strahlenschutz (BfS),
Ressortforschungsberichte zur kerntechnischen Sicherheit und zum Strahlenschutz, BfS-RESFOR-143/19: 1-226