Die folgenden Begriffe wurden einbezogen:
Elektroenzephalographie, EEG, electroencephalography, 脳電図記録法
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2018,
Zhao Y, Lai JJ, Wu XY, Qu W, Wang MQ, Chen L, Hu N, Wang X, Hou WS
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: 2240-2243; ISBN 978-1-5386-3647-3
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2018,
Cui H, Wei J, Ke Y, An X, Sun C, Xu M, Qi H, Ming D, Zhou P
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: 3481-3484; ISBN 978-1-5386-3647-3
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2018,
Bhangari DS, Bhagali AC, Kshirsagar RV
2018 Second International Conference on Intelligent Computing and Control Systems (ICICCS), Madurai, India. IEEE: 1679-1683; ISBN 978-1-5386-2843-0
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2018,
Al-Kaysi AM, Al-Ani A, Galvez V, Colleen Loo K, Ling S, Tjeerd Boonstra W
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: 3677-3680; ISBN 978-1-5386-3647-3
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2018,
He Y, Sun W, Leung PSW, Siu TYM, Ng KT
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: 936-939; ISBN 978-1-5090-3955-5
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2017,
Whungtrakulchai T, Charoenwat W, Sittiprapaporn P
2017 14th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON), Phuket, Thailand. IEEE; ISBN 978-1-5386-0450-2
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2016,
Smitha CK, Narayanan NK
2016 SAI Computing Conference (SAI), London. IEEE: 990-995; ISBN 978-1-4673-8461-2
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2016,
Lay-Ekuakille A, Griffo G, Conversano F, Casciaro S, Massaro A, Bhateja V, Spano F
2016 IEEE International Symposium on Medical Measurements and Applications (MeMeA), Benevento, Italy. IEEE: 1-6; ISBN 978-1-4673-9173-3
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2016,
Lingdi F, Guizhi X, Hongli Y, Miaomiao G, Ning Y
2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), Shenzhen, China. IEEE: 1035-1037; ISBN 978-1-4673-9494-9
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2016,
He Y, Diao Y, Sun W, Leung SW, Siu YM
2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), Shenzhen, China. IEEE: 639-641; ISBN 978-1-4673-9494-9