Die folgenden Begriffe wurden einbezogen:
Frequenz, frequency, 頻度、周波数
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2020 SoutheastCon, Raleigh, NC, USA. IEEE: 1-4; ISBN 978-1-7281-6862-3
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2020,
Risman PO, Petrović N
2020 23rd International Microwave and Radar Conference (MIKON), Warsaw, Poland. IEEE: 386-391; ISBN 978-1-7281-5787-0
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2020,
De Risio L, Borgi M, Pettorruso M, Miuli A, Ottomana AM, Sociali A, Martinotti G, Nicolò G, Macrì S, di Giannantonio M, Zoratto F
Transl Psychiatry 10 (1): 393
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2020,
Perova I, Litovchenko O, Zavgorodnii I, Brazhnykova Y, Kovalenko A
2020 IEEE Ukrainian Microwave Week (UkrMW), Kharkiv, Ukraine. IEEE: 594-598; ISBN 978-1-7281-7314-6
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2020,
Rahimi Z, Lohrasebi A
Phys Chem Chem Phys 22 (44): 25859-25868
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2020,
Oberman LM, Exley S, Philip NS, Siddiqi SH, Adamson MM, Brody DL
J Head Trauma Rehabil 35 (6): 388-400
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2020,
Crawford J, Saria MG, Dhall G, Margol A, Kesari S
Cureus 12 (10): e10804
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2020,
Kim JY, Jo Y, Oh HK, Kim EH
Am J Cancer Res 10 (10): 3475-3486
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2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-5; ISBN 978-1-7281-5580-7
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2020,
Dergham I, Martinez Rocha JC, Imad R, Alayli Y
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-5; ISBN 978-1-7281-5580-7
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2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5580-7
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2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-6; ISBN 978-1-7281-5580-7
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2020,
Ramos V, Trillo AM, Suarez OJ, Suarez S, Febles VM, Rabassa LE, Karpowicz J, Fernandez de Aldecoa JC, Hernandez JA
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-5; ISBN 978-1-7281-5580-7
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2020,
Simonazzi M, Sandrolini L, Reggiani U
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-5; ISBN 978-1-7281-5580-7
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2020,
Song X, Yue Y, Zhu X, Chang H
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5580-7
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2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5580-7
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2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5580-7
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2020,
Miwa K, Takenaka T, Hirata A
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5580-7
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2020,
Gravina A, Moglie F, Bastianelli L, Mariani Primiani V
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-6; ISBN 978-1-7281-5580-7
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2020,
Cruciani S, Campi T, Maradei F, Feliziani M
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5580-7
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2020,
Kamimura Y, Daimon K, Matsumoto N, Kimura S, Sato K
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5580-7
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2020,
Di Francesco A, De Santis V
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-5; ISBN 978-1-7281-5580-7
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2020,
Lämmle T, Parspour N, Mönch M
2020 5th International Conference on Smart and Sustainable Technologies (SpliTech), Split, Croatia. IEEE: 1-6; ISBN 978-1-7281-7363-4
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2020,
Poljak D, Cvetković M
2020 5th International Conference on Smart and Sustainable Technologies (SpliTech), Split, Croatia. IEEE: 1-4; ISBN 978-1-7281-7363-4
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2020,
Murakawa T, Diao Y, Rashed EA, Kodera S, Tanaka Y, Kamimura Y, Kitamura S, Uehara S, Otaka Y, Hirata A
IEEE Access 8: 200995-201004