Die folgenden Begriffe wurden einbezogen:
Kumulation, accumulation, cumulation
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Honorato D, Giannakoulopoulos A (Hrsg.): Taboo - Transgression - Transcendence in Art and Science (TTT 2016), Proceedings of Interdisciplinary Conference, 20-22 May 2016, Ionian University (Department of Audio and Visual Arts), Corfu, Greece. Ionian University Press; 566-583; ISBN 978-960-7260-59-8
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2016,
Salceanu A, Lunca E, Neacsu O, Iacobescu F
2016 International Conference and Exposition on Electrical and Power Engineering (EPE), Iasi, Romania. International Conference and Exposition on Electrical and Power Engineering; IEEE: 592-597
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2016,
Liu H, Yao C, Mi Y, Li C, Zhao Y, Lv Y
2016 IEEE International Power Modulator and High Voltage Conference (IPMHVC), San Francisco, CA, USA. IEEE; ISBN 978-1-5090-2355-4
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2016,
Salceanu A, Paulet M, Ursache S, Poenaru MM
2016 International Conference and Exposition on Electrical and Power Engineering (EPE), Iasi, Romania. IEEE; ISBN 978-1-5090-6130-3
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2016,
Jurčević M, Malarić K
2016 24th International Conference on Software, Telecommunications and Computer Networks (SoftCOM), Split. IEEE; ISBN 978-1-5090-2578-7
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2016,
Molla-Djafari H, Schiessl K, Schmid G, Kundi M, Knasmüller S, Mosgöller W
Allgemeine Unfallversicherungsanstalt (AUVA),
AUVA Report, Nr. 70: 1-188
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2014,
Abdellaouy HE, Pelov A, Toutain L, Bernard D
2014 IEEE 11th Consumer Communications and Networking Conference (CCNC), Las Vegas, NV, USA. IEEE: 107-114; ISBN 978-1-4799-2356-4
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2014,
Suzuki Y, Koike A, Takamura M, Taki M, Kojima M, Sasaki K, Chakarothai J, Wake K, Watanabe S
2014 International Symposium on Electromagnetic Compatibility, Gothenburg, Sweden. IEEE: 832-835; ISBN 978-4-88552-287-1
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2013,
Naim-Feil J, Zangen A
Lozano AM, Hallett M (Hrsg.): Brain Stimulation. Handbook of Clinical Neurology, Band 116; Elsevier, Amsterdam; 613-630; ISBN 978-0-444-53497-2
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2012,
Mahfouz Z, Gati A, Lautru D, Wiart J, Fouad Hanna V
2012 IEEE Topical Conference on Biomedical Wireless Technologies, Networks, and Sensing Systems (BioWireleSS), Santa Clara, CA, USA. IEEE: 77-80; ISBN 978-1-4577-1135-0