Die folgenden Begriffe wurden einbezogen:
Leitfähigkeit, conductivity, conductance, 伝導率
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2019,
Small AT, Dougherty ET
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: 2340-2343; ISBN 978-1-5386-1312-2
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2019,
Kroll MW, Kroll LC, Panescu D, Perkins PE, Andrews CJ
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: 1769-1775; ISBN 978-1-5386-1312-2
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2019,
Khan A, Haueisen J, Wolters CH, Antonakakis M, Vogenauer N, Wollbrink A, Suntrup-Krueger S, Schneider TR, Herrmann CS, Nitsche M, Paulus W
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: 5894-5897; ISBN 978-1-5386-1312-2
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2019,
Colella M, Paffi A, Fontana S, Rossano F, De Santis V, Apollonio F, Liberti M
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: 2917-2920; ISBN 978-1-5386-1312-2
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2019,
De Angelis A, Denzi A, Merla C, Andre FM, Garcia-Sanchez T, Mir LM, Apollonio F, Liberti M
2019 49th European Microwave Conference (EuMC), Paris, France. IEEE: 212-215; ISBN 978-1-7281-1798-0
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2019,
Šmondrk M, Beňová M
2019 IEEE 20th International Conference on Computational Problems of Electrical Engineering (CPEE), Lviv-Slavske, Ukraine. IEEE: 1-4; ISBN 978-1-7281-2811-5
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2019,
Kageyama I, Masuda H, Morimatsu Y, Ishitake T, Sakakibara K, Hikage T, Hirata A
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan. IEEE: 766-769; ISBN 978-1-7281-1639-6
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2019,
Lagouanelle P, Krauth VL, Pichon L
2019 AEIT International Conference of Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE), Torino, Italy. IEEE: 1-5; ISBN 978-1-7281-3278-5
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2018,
Soontornpipit P, Satitvipawee P
2018 International Electrical Engineering Congress (iEECON), Krabi, Thailand. IEEE: 1-4; ISBN 978-1-5386-2318-3
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2018,
Sun X, Lu L, Liu X, Chen W
2018 IEEE Nuclear Science Symposium and Medical Imaging Conference Proceedings (NSS/MIC), Sydney, NSW, Australia. IEEE: 1-4; ISBN 978-1-5386-8495-5